Inventor · disambiguated record
Ralf Schmid
Also filed as: SCHMID RALF · SCHMID RALF-RAINER
39 granted patents·7 pending applications·500 citations·filing 1985–2025
98Inventor score
Files withAPPLIED MATERIALS INC14BOSCH GMBH ROBERT6UNIV PENNSYLVANIA5KNORR BREMSE SYSTEME4SIEMENS AG4
Top patents by PatentIndex Score
46 records- 0189US6465795B1Charge neutralization of electron beam systemsAPPLIED MATERIALS INC·Filed 2000·Granted Oct 15, 2002·40 cites·40 claims
- 0288US7319335B2Configurable prober for TFT LCD array testingAPPLIED MATERIALS INC·Filed 2004·Granted Jan 15, 2008·38 cites·12 claims
- 0388US6730906B2Method and apparatus for testing a substrateAPPLIED MATERIALS INC·Filed 2001·Granted May 4, 2004·29 cites·28 claims
- 0488US6417455B1Conductive foilBOSCH GMBH ROBERT·Filed 2000·Granted Jul 9, 2002·40 cites·9 claims
- 0585US6697257B1Power semiconductor moduleBOSCH GMBH ROBERT·Filed 2000·Granted Feb 24, 2004·54 cites·29 claims
- 0685US2025308835A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0785US2025308836A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0884US4983833ADevice for the detecting of charged secondary particlesSIEMENS AG·Filed 1989·Granted Jan 8, 1991·38 cites·13 claims
- 0982US7746088B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2009·Granted Jun 29, 2010·6 cites·20 claims
- 1079US7535238B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2006·Granted May 19, 2009·5 cites·25 claims
- 1176US5258706AMethod for the recognition of testing errors in the test of microwiringsSIEMENS AG·Filed 1992·Granted Nov 2, 1993·33 cites·6 claims
- 1274US6894411B2Electric machine designed as a starter, generator or starter-generator for a motor vehicleISAD ELECTRONIC SYS GMBH & CO·Filed 2003·Granted May 17, 2005·18 cites·25 claims
- 1374US6743298B2Method for cleaning vehicle windowsBOSCH GMBH ROBERT·Filed 2001·Granted Jun 1, 2004·15 cites·6 claims
- 1474US6615954B2Monitoring system and method for brake disksKNORR BREMSE SYSTEME·Filed 2001·Granted Sep 9, 2003·14 cites·25 claims
- 1573US8020906B2Easily mountable motor vehicle crash apparatusPORSCHE AG·Filed 2008·Granted Sep 20, 2011·12 cites·15 claims
- 1671US6030040ASeat and/or backrest part of folding furniture, especially garden or camping furnitureSIMONE BURK SEITZ·Filed 1997·Granted Feb 29, 2000·56 cites·6 claims
- 1770US7786742B2Prober for electronic device testing on large area substratesAPPLIED MATERIALS INC·Filed 2007·Granted Aug 31, 2010·2 cites·18 claims
- 1869US7355418B2Configurable prober for TFT LCD array testAPPLIED MATERIALS INC·Filed 2004·Granted Apr 8, 2008·14 cites·25 claims
- 1969US6808237B2Method and device for controlling the supply of a pressure medium on rail vehicles (compressor management)KNORR BREMSE SYSTEME·Filed 2001·Granted Oct 26, 2004·11 cites·18 claims
- 2066US12362131B2Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 15, 2025·0 cites·26 claims
- 2166US2024425882A1Compositions useful in treatment of cdkl5 deficiency disorder (cdd)UNIV PENNSYLVANIA·Filed 2022·Application pending·0 cites
- 2265US7973546B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2010·Granted Jul 5, 2011·1 cites·20 claims
- 2364US7569818B2Method to reduce cross talk in a multi column e-beam test systemAPPLIED MATERIALS INC·Filed 2007·Granted Aug 4, 2009·6 cites·25 claims
- 2462USD393239SWheelRIAL LEICHTMETALLFELGEN GMBH·Filed 1996·Granted Apr 7, 1998·13 cites·1 claims
- 2560US2023167455A1Compositions useful in treatment of cdkl5 deficiency disorder (cdd)UNIV PENNSYLVANIA·Filed 2021·Application pending·0 cites
- 2660US2023167438A1Compositions and uses thereof for treatment of angelman syndromeUNIV PENNSYLVANIA·Filed 2021·Application pending·0 cites
- 2759US9376087B2Front module of a motor vehiclePORSCHE AG·Filed 2014·Granted Jun 28, 2016·2 cites·8 claims
- 2859US2023414785A1Compositions and uses thereof for treatment of angelman syndromeUNIV PENNSYLVANIA·Filed 2021·Application pending·0 cites
- 2958US7847566B2Configurable prober for TFT LCD array testAPPLIED MATERIALS INC·Filed 2007·Granted Dec 7, 2010·0 cites·5 claims
- 3058US7105833B2Deflection system for a particle beam deviceAKT ELECTRON BEAM TECHNOLOGY G·Filed 2002·Granted Sep 12, 2006·5 cites·20 claims
- 3156US2022202960A1Compositions useful in treatment of rett syndromeUNIV PENNSYLVANIA·Filed 2020·Application pending·0 cites
- 3255US6706236B2Method for making holes in ceramic green sheetsBOSCH GMBH ROBERT·Filed 2000·Granted Mar 16, 2004·7 cites·10 claims
- 3354US6905180B2Method and device for monitoring the effectiveness of vehicle braking systemsKNORR BREMSE SYSTEME·Filed 2001·Granted Jun 14, 2005·4 cites·10 claims
- 3453US8297680B2Device for reinforcementSCHMID RALF·Filed 2010·Granted Oct 30, 2012·2 cites·4 claims
- 3548US10748743B1Device and method for operating a charged particle device with multiple beamletsICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2019·Granted Aug 18, 2020·0 cites·21 claims
- 3647US6700191B2Electronic power circuit of several power modulesISAD ELECTRONIC SYS GMBH & CO·Filed 2002·Granted Mar 2, 2004·5 cites·15 claims
- 3746US11552536B2Electric motor and inverter assemblyBOSCH GMBH ROBERT·Filed 2017·Granted Jan 10, 2023·0 cites·13 claims
- 3846US7009116B2Contact device and a process to facilitate contact of power electronics components and an assembly that consists of one or several power electronics componentsCONTI TEMIC MICROELECTRIC·Filed 2002·Granted Mar 7, 2006·4 cites·5 claims
- 3945US6435881B1Device for the electrical and mechanical connection of two printed circuit boardsBOSCH GMBH ROBERT·Filed 2000·Granted Aug 20, 2002·4 cites·14 claims
- 4044US8222911B2Light-assisted testing of an optoelectronic moduleMUELLER BERNHARD GUNTER·Filed 2007·Granted Jul 17, 2012·0 cites·24 claims
- 4144US6945611B2Braking system for vehicle provided with ABS or an anti-skid protection systemKNORR BREMSE SYSTEME·Filed 2001·Granted Sep 20, 2005·6 cites·4 claims
- 4244US4640626AMethod and apparatus for localizing weak points within an electrical circuitSIEMENS AG·Filed 1985·Granted Feb 3, 1987·11 cites·14 claims
- 4342US8009299B2Method for beam calibration and usage of a calibration bodyAPPLIED MATERIALS GMBH·Filed 2006·Granted Aug 30, 2011·0 cites·22 claims
- 4437US7256606B2Method for testing pixels for LCD TFT displaysAPPLIED MATERIALS INC·Filed 2004·Granted Aug 14, 2007·0 cites·21 claims
- 4536US7375505B2Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test methodAPPLIED MATERIALS INC·Filed 2002·Granted May 20, 2008·0 cites·19 claims
- 4636US5373233AMethod for the recognition of testing errors in the test of microwiringsSIEMENS AG·Filed 1993·Granted Dec 13, 1994·5 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →