Inventor · disambiguated record
Edgar Genio
Also filed as: GENIO EDGAR · GENIO EDGAR B
10 granted patents·172 citations·filing 2004–2012
87Inventor score
Top patents by PatentIndex Score
10 records- 0196US7026175B2High throughput measurement of via defects in interconnectsAPPLIED MATERIALS INC·Filed 2004·Granted Apr 11, 2006·137 cites·17 claims
- 0286US8767209B2Broadband polarization spectrometer with inclined incidence and optical measurement systemLI GUOGUANG·Filed 2011·Granted Jul 1, 2014·10 cites·28 claims
- 0377US9170156B2Normal-incidence broadband spectroscopic polarimeter containing reference beam and optical measurement systemLI GUOGUANG·Filed 2012·Granted Oct 27, 2015·5 cites·25 claims
- 0470US8018586B2Metrology of thin film devices using an addressable micromirror arrayAPPLIED MATERIALS INC·Filed 2009·Granted Sep 13, 2011·5 cites·7 claims
- 0568US7379185B2Evaluation of openings in a dielectric layerAPPLIED MATERIALS INC·Filed 2004·Granted May 27, 2008·11 cites·48 claims
- 0660US7911603B2Spectrometric metrology of workpieces using a permanent window as a spectral referenceAPPLIED MATERIALS INC·Filed 2009·Granted Mar 22, 2011·2 cites·19 claims
- 0758US7969568B2Spectrographic metrology of patterned wafersAPPLIED MATERIALS INC·Filed 2009·Granted Jun 28, 2011·2 cites·20 claims
- 0849US8027031B2Spectrometric metrology of workpieces using a permanent window as a spectral referenceAPPLIED MATERIALS INC·Filed 2011·Granted Sep 27, 2011·0 cites·17 claims
- 0948US9176048B2Normal incidence broadband spectroscopic polarimeter and optical measurement systemLI GUOGUANG·Filed 2011·Granted Nov 3, 2015·0 cites·26 claims
- 1042US8130373B2Metrology of thin film devices using an addressable micromirror arrayGENIO EDGAR·Filed 2011·Granted Mar 6, 2012·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →