Inventor · disambiguated record
Sean Zumwalt
Also filed as: ZUMWALT SEAN DALE · Zumwalt Sean
2 granted patents·1 pending application·2 citations·filing 2016–2017
38Inventor score
Top patents by PatentIndex Score
3 records- 0169US9869696B2Method for imaging a feature using a scanning probe microscopeDCG SYSTEMS INC·Filed 2016·Granted Jan 16, 2018·1 cites·22 claims
- 0266US10139429B2Method for calibrating and imaging using multi-tip scanning probe microscopeFEI CO·Filed 2017·Granted Nov 27, 2018·1 cites·17 claims
- 0331US2017003336A1Diamond delayering for electrical probingDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →