Inventor · disambiguated record
Dean Hunt
Also filed as: HUNT DEAN · HUNT DEAN M
4 granted patents·43 citations·filing 2002–2006
76Inventor score
Top patents by PatentIndex Score
4 records- 0189US7299148B2Methods and apparatus for low distortion parameter measurementsONWAFER TECHNOLOGIES INC·Filed 2005·Granted Nov 20, 2007·20 cites·23 claims
- 0275US7482576B2Apparatuses for and methods of monitoring optical radiation parameters for substrate processing operationsKLA TENCOR CORP·Filed 2006·Granted Jan 27, 2009·8 cites·25 claims
- 0355US6836014B2Optical testing of integrated circuits with temperature controlCREDENCE SYSTEMS CORP·Filed 2002·Granted Dec 28, 2004·8 cites·15 claims
- 0454US7064568B2Optical testing of integrated circuits with temperature controlCREDENCE SYSTEMS CORP·Filed 2004·Granted Jun 20, 2006·7 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →