Inventor · disambiguated record
William Goldfarb
Also filed as: GOLDFARB WILLIAM · GOLDFARB WILLIAM C
7 granted patents·1 pending application·424 citations·filing 1987–2007
88Inventor score
Files withSEMITEST INC3OPTICAL DIAGNOSTIC SYSTEMS INC2ADE CORP1QC SOLUTIONS INC1UNIVERSAL DYNAMICS INC1
Top patents by PatentIndex Score
8 records- 0195US5091691AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Feb 25, 1992·132 cites·19 claims
- 0294US4891584AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Jan 2, 1990·218 cites·37 claims
- 0375US5453703AMethod for determining the minority carrier surface recombination lifetime constant (ts of a specimen of semiconductor materialSEMITEST INC·Filed 1993·Granted Sep 26, 1995·41 cites·9 claims
- 0461US6594002B2Wafer shape accuracy using symmetric and asymmetric instrument error signaturesADE CORP·Filed 2001·Granted Jul 15, 2003·8 cites·14 claims
- 0557US7104743B2Vacuum receiver with positive dump valve controlUNIVERSAL DYNAMICS INC·Filed 2004·Granted Sep 12, 2006·10 cites·11 claims
- 0655US4873436ANondestructive readout of a latent electrostatic image formed on an insulating materialOPTICAL DIAGNOSTIC SYSTEMS INC·Filed 1987·Granted Oct 10, 1989·12 cites·13 claims
- 0735US2008036464A1Probes and methods for semiconductor wafer analysisQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 0834US4833324ANondestructive readout of a latent electrostatic image formed on an insulating materialOPTICAL DIAGNOSTIC SYSTEMS INC·Filed 1987·Granted May 23, 1989·3 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when William Goldfarb files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →