Assignee
QC SOLUTIONS INC
US·13 granted patents·4 pending applications·315 citations·filing 1995–2007
Top patents by PatentIndex Score
17 records- 0194US5661408AReal-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1995·Granted Aug 26, 1997·128 cites·39 claims
- 0286US6315574B1Method for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2000·Granted Nov 13, 2001·24 cites·18 claims
- 0384US6388455B1Method and apparatus for simulating a surface photo-voltage in a substrateQC SOLUTIONS INC·Filed 2000·Granted May 14, 2002·47 cites·27 claims
- 0479US6803588B2Apparatus and method for rapid photo-thermal surfaces treatmentQC SOLUTIONS INC·Filed 2001·Granted Oct 12, 2004·19 cites·9 claims
- 0575US6325078B2Apparatus and method for rapid photo-thermal surface treatmentQC SOLUTIONS INC·Filed 1998·Granted Dec 4, 2001·39 cites·15 claims
- 0672US6069017AMethod for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1997·Granted May 30, 2000·25 cites·2 claims
- 0765US6909302B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2001·Granted Jun 21, 2005·6 cites·5 claims
- 0864US7403023B2Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.QC SOLUTIONS INC·Filed 2006·Granted Jul 22, 2008·3 cites·23 claims
- 0963US6911350B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Jun 28, 2005·12 cites·23 claims
- 1056US6967490B1Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Nov 22, 2005·3 cites·16 claims
- 1153US6924657B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Aug 2, 2005·2 cites·15 claims
- 1249US7160742B2Methods for integrated implant monitoringQC SOLUTIONS INC·Filed 2004·Granted Jan 9, 2007·3 cites·15 claims
- 1346US7119569B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2004·Granted Oct 10, 2006·4 cites·17 claims
- 1439US2008048636A1Method and apparatus for silicon-on-insulator material characterizationQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 1538US2008182347A1Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (SOI) wafer manufacturingQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
- 1637US2008020549A1Method and apparatus for forming an oxide layer on semiconductorsQC SOLUTIONS INC·Filed 2006·Application pending·0 cites
- 1735US2008036464A1Probes and methods for semiconductor wafer analysisQC SOLUTIONS INC·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →