Inventor · disambiguated record
Stan Johan Pieter Konings
Also filed as: KONINGS STAN JOHAN PIETER
5 granted patents·4 citations·filing 2012–2023
68Inventor score
Top patents by PatentIndex Score
5 records- 0181US12176179B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Dec 24, 2024·0 cites·11 claims
- 0281US11587759B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2018·Granted Feb 21, 2023·2 cites·13 claims
- 0379US11817290B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Nov 14, 2023·0 cites·9 claims
- 0459US9658246B2Method of studying a sample in an ETEMKONINGS STAN JOHAN PIETER·Filed 2012·Granted May 23, 2017·2 cites·13 claims
- 0549US9570270B2Method of using an environmental transmission electron microscopeFEI CO·Filed 2014·Granted Feb 14, 2017·0 cites·21 claims
Join the waitlist — get patent alerts
Get an alert when Stan Johan Pieter Konings files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →