Inventor · disambiguated record
Anbiarshy Wu
Also filed as: WU ANBIARSHY · WU ANBIARSHY N F
7 granted patents·2 pending applications·92 citations·filing 2006–2008
85Inventor score
Top patents by PatentIndex Score
9 records- 0194US8334582B2Protective seal ring for preventing die-saw induced stressJENG SHIN-PUU·Filed 2008·Granted Dec 18, 2012·39 cites·20 claims
- 0288US7732892B2Fuse structures and integrated circuit devicesTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Jun 8, 2010·19 cites·4 claims
- 0385US7776627B2Flexible structures for interconnect reliability testTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Aug 17, 2010·10 cites·21 claims
- 0481US9601443B2Test structure for seal ring quality monitorTSAI HAO-YI·Filed 2007·Granted Mar 21, 2017·8 cites·20 claims
- 0576US7714443B2Pad structure design with reduced densityTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted May 11, 2010·7 cites·20 claims
- 0674US8227917B2Bond pad design for fine pitch wire bondingHSU SHIH-HSUN·Filed 2007·Granted Jul 24, 2012·7 cites·11 claims
- 0761US7811866B2Single passivation layer scheme for forming a fuseTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Oct 12, 2010·2 cites·16 claims
- 0843US2008246031A1PCM pad design for peeling preventionTSAI HAO-YI·Filed 2007·Application pending·0 cites
- 0942US2008277659A1Test structure for semiconductor chipHSU SHIH-HSUN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →