Inventor · disambiguated record
Naoyoshi Kikuchi
Also filed as: KIKUCHI NAOYOSHI
2 granted patents·1 pending application·22 citations·filing 2000–2007
59Inventor score
Technology areasG01R
Files withFUJITSU LTD3
Top patents by PatentIndex Score
3 records- 0164US6407572B1System and method for testing and evaluating a deviceFUJITSU LTD·Filed 2000·Granted Jun 18, 2002·17 cites·6 claims
- 0246US7180312B2Probe card and method for manufacturing probe cardFUJITSU LTD·Filed 2003·Granted Feb 20, 2007·5 cites·15 claims
- 0336US2007134824A1Probe card and method for manufacturing probe cardFUJITSU LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →