Inventor · disambiguated record
Robert Campbell Aitken
Also filed as: AITKEN ROBERT · AITKEN ROBERT C · AITKEN ROBERT CAMPBELL
50 granted patents·1 pending application·798 citations·filing 1999–2019
98Inventor score
Files withADVANCED RISC MACH LTD36CHANDRA VIKAS4AGILENT TECHNOLOGIES INC3IDGUNJI SACHIN SATISH3AITKEN ROBERT CAMPBELL2
Top patents by PatentIndex Score
51 records- 0199US9589636B1Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2015·Granted Mar 7, 2017·104 cites·15 claims
- 0299US9558819B1Method, system and device for non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2015·Granted Jan 31, 2017·89 cites·20 claims
- 0398US9748943B2Programmable current for correlated electron switchADVANCED RISC MACH LTD·Filed 2015·Granted Aug 29, 2017·29 cites·21 claims
- 0498US9548118B1Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2015·Granted Jan 17, 2017·35 cites·20 claims
- 0597US9747982B1Device and method for generating random numbersADVANCED RISC MACH LTD·Filed 2016·Granted Aug 29, 2017·29 cites·14 claims
- 0697US7737720B2Virtual power rail modulation within an integrated circuitADVANCED RISC MACH LTD·Filed 2007·Granted Jun 15, 2010·49 cites·46 claims
- 0796US9979385B2Circuit and method for monitoring correlated electron switchesADVANCED RISC MACH LTD·Filed 2015·Granted May 22, 2018·19 cites·16 claims
- 0896US9851738B2Programmable voltage referenceADVANCED RISC MACH LTD·Filed 2015·Granted Dec 26, 2017·19 cites·21 claims
- 0996US8717078B2Sequential latching device with elements to increase hold times on the diagnostic data pathIDGUNJI SACHIN SATISH·Filed 2012·Granted May 6, 2014·25 cites·18 claims
- 1095US10032487B2One-time and multi-time programming using a correlated electron switchADVANCED RISC MACH LTD·Filed 2016·Granted Jul 24, 2018·19 cites·21 claims
- 1195US9990992B2Method, system and device for non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2016·Granted Jun 5, 2018·17 cites·13 claims
- 1295US9805777B2Sense amplifierADVANCED RISC MACH LTD·Filed 2016·Granted Oct 31, 2017·18 cites·13 claims
- 1395US9786370B2CES-based latching circuitsADVANCED RISC MACH LTD·Filed 2016·Granted Oct 10, 2017·17 cites·16 claims
- 1495US6191603B1Modular embedded test system for use in integrated circuitsAGILENT TECHNOLOGIES INC·Filed 1999·Granted Feb 20, 2001·143 cites·6 claims
- 1593US8488369B2Method of altering distribution of a chosen characteristic of a plurality of memory cells forming a memory deviceCHANDRA VIKAS·Filed 2011·Granted Jul 16, 2013·19 cites·13 claims
- 1686US9483664B2Address dependent data encryptionADVANCED RISC MACH LTD·Filed 2014·Granted Nov 1, 2016·7 cites·15 claims
- 1786US7605644B2Integrated circuit power-on control and programmable comparatorADVANCED RISC MACH LTD·Filed 2007·Granted Oct 20, 2009·14 cites·27 claims
- 1885US6380780B1Integrated circuit with scan flip-flopAGILENT TECHNOLOGIES INC·Filed 2000·Granted Apr 30, 2002·33 cites·19 claims
- 1984US8390328B2Supplying a clock signal and a gated clock signal to synchronous elementsMYERS JAMES EDWARD·Filed 2011·Granted Mar 5, 2013·8 cites·24 claims
- 2083US8347728B2Stress detection within an integrated circuit having through silicon viasADVANCED RISC MACH LTD·Filed 2010·Granted Jan 8, 2013·7 cites·21 claims
- 2183US8145958B2Integrated circuit and method for testing memory on the integrated circuitAITKEN ROBERT CAMPBELL·Filed 2005·Granted Mar 27, 2012·20 cites·14 claims
- 2281US9929149B2Using inter-tier vias in integrated circuitsADVANCED RISC MACH LTD·Filed 2016·Granted Mar 27, 2018·4 cites·20 claims
- 2380US8555124B2Apparatus and method for detecting an approaching error conditionIDGUNJI SACHIN SATISH·Filed 2010·Granted Oct 8, 2013·6 cites·19 claims
- 2479US7863733B2Integrated circuit with multiple layers of circuitsADVANCED RISC MACH LTD·Filed 2008·Granted Jan 4, 2011·8 cites·25 claims
- 2578US8164964B2Boosting voltage levels applied to an access control line when accessing storage cells in a memoryCHANDRA VIKAS·Filed 2009·Granted Apr 24, 2012·11 cites·20 claims
- 2677US9449717B2Memory built-in self-test for a data processing apparatusADVANCED RISC MACH LTD·Filed 2014·Granted Sep 20, 2016·6 cites·17 claims
- 2773US10236888B2Correlated electron switch deviceADVANCED RISC MACH LTD·Filed 2016·Granted Mar 19, 2019·2 cites·13 claims
- 2873US9966138B2Device and method for generating random numbersADVANCED RISC MACH LTD·Filed 2017·Granted May 8, 2018·1 cites·16 claims
- 2972US10049735B2Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2017·Granted Aug 14, 2018·2 cites·21 claims
- 3072US8339876B2Memory with improved read stabilityCHANDRA VIKAS·Filed 2009·Granted Dec 25, 2012·10 cites·16 claims
- 3170US9529671B2Error detection in stored data valuesADVANCED RISC MACH LTD·Filed 2014·Granted Dec 27, 2016·2 cites·17 claims
- 3269US7734974B2Serial scan chain control within an integrated circuitADVANCED RISC MACH LTD·Filed 2007·Granted Jun 8, 2010·6 cites·13 claims
- 3362US10043559B2Sense amplifierADVANCED RISC MACH LTD·Filed 2017·Granted Aug 7, 2018·1 cites·20 claims
- 3462US10008263B2Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2016·Granted Jun 26, 2018·1 cites·20 claims
- 3562US8103990B2Characterising circuit cell performance variability in response to perturbations in manufacturing process parametersIDGUNJI SACHIN SATISH·Filed 2008·Granted Jan 24, 2012·2 cites·14 claims
- 3657US6980943B2Flow for vector captureAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 27, 2005·11 cites·20 claims
- 3755US10958266B2Programmable current for correlated electron switchADVANCED RISC MACH LTD·Filed 2019·Granted Mar 23, 2021·0 cites·17 claims
- 3854US8103918B2Clock control during self-test of multi port memoryAITKEN ROBERT CAMPBELL·Filed 2008·Granted Jan 24, 2012·3 cites·23 claims
- 3952US10388377B2Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2018·Granted Aug 20, 2019·0 cites·20 claims
- 4052US9760438B2Error detection in stored data valuesADVANCED RISC MACH LTD·Filed 2014·Granted Sep 12, 2017·0 cites·16 claims
- 4150US10447260B2Programmable current for correlated electron switchADVANCED RISC MACH LTD·Filed 2017·Granted Oct 15, 2019·0 cites·20 claims
- 4250US10354727B2Circuit and method for monitoring correlated electron switchesADVANCED RISC MACH LTD·Filed 2018·Granted Jul 16, 2019·0 cites·18 claims
- 4350US10276238B2Method, system and device for complementary non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2018·Granted Apr 30, 2019·0 cites·19 claims
- 4449US2017046281A1Address dependent data encryptionADVANCED RISC MACH LTD·Filed 2016·Application pending·0 cites
- 4547US10127981B2Method, system and device for non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2018·Granted Nov 13, 2018·0 cites·18 claims
- 4645US11347254B2Programmable voltage referenceADVANCED RISC MACH LTD·Filed 2017·Granted May 31, 2022·0 cites·19 claims
- 4745US10083748B2Method, system and device for non-volatile memory device operationADVANCED RISC MACH LTD·Filed 2016·Granted Sep 25, 2018·0 cites·17 claims
- 4844US11355192B2CES-based latching circuitsADVANCED RISC MACH LTD·Filed 2017·Granted Jun 7, 2022·0 cites·19 claims
- 4940US6999354B2Dynamically adaptable memoryARM PHYSICAL IP INC·Filed 2004·Granted Feb 14, 2006·2 cites·9 claims
- 5032US8116165B2Memory with improved data reliabilityCHANDRA VIKAS·Filed 2010·Granted Feb 14, 2012·0 cites·21 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →