Inventor · disambiguated record
Yoichi Ose
Also filed as: OSE YOICHI
72 granted patents·8 pending applications·1,122 citations·filing 1989–2022
99Inventor score
Top patents by PatentIndex Score
80 records- 0198US6847038B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Jan 25, 2005·74 cites·12 claims
- 0296US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0396US5668368AApparatus for suppressing electrification of sample in charged beam irradiation apparatusHITACHI LTD·Filed 1996·Granted Sep 16, 1997·98 cites·19 claims
- 0495US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 0595US7075078B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Jul 11, 2006·20 cites·12 claims
- 0695US6646262B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Nov 11, 2003·57 cites·18 claims
- 0793US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 0892US6787772B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 7, 2004·32 cites·15 claims
- 0992US5608218AScanning electron microscopeHITACHI LTD·Filed 1994·Granted Mar 4, 1997·69 cites·22 claims
- 1090US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 1190US7282722B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 16, 2007·10 cites·10 claims
- 1289US7411192B2Focused ion beam apparatus and focused ion beam irradiation methodHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 12, 2008·12 cites·28 claims
- 1389US5894124AScanning electron microscope and its analogous deviceHITACHI LTD·Filed 1997·Granted Apr 13, 1999·61 cites·28 claims
- 1489US5576538AApparatus and method for ion beam neutralizationHITACHI LTD·Filed 1995·Granted Nov 19, 1996·47 cites·22 claims
- 1588US7408172B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 5, 2008·8 cites·10 claims
- 1688US6885001B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted Apr 26, 2005·20 cites·13 claims
- 1788US6872944B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Mar 29, 2005·24 cites·6 claims
- 1887US7825377B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 2, 2010·6 cites·12 claims
- 1987US7459681B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted Dec 2, 2008·8 cites·15 claims
- 2086US7399966B2Scanning electron microscopeHITACHI LTD·Filed 2007·Granted Jul 15, 2008·6 cites·5 claims
- 2185US10707046B2Electron source and electron beam device using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 7, 2020·3 cites·13 claims
- 2285US7022983B2Monochromator and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2004·Granted Apr 4, 2006·15 cites·18 claims
- 2385US6555819B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Apr 29, 2003·19 cites·22 claims
- 2485US5466929AApparatus and method for suppressing electrification of sample in charged beam irradiation apparatusHITACHI LTD·Filed 1993·Granted Nov 14, 1995·37 cites·17 claims
- 2584US7315024B2Monochromator and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 1, 2008·5 cites·17 claims
- 2684US6956211B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2003·Granted Oct 18, 2005·15 cites·14 claims
- 2784US6667476B2Scanning electron microscopeHITACHI LTD·Filed 1999·Granted Dec 23, 2003·40 cites·30 claims
- 2884US6043491AScanning electron microscopeHITACHI LTD·Filed 1998·Granted Mar 28, 2000·44 cites·6 claims
- 2983US11251011B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 15, 2022·3 cites·8 claims
- 3082US7838827B2Monochromator and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 23, 2010·4 cites·7 claims
- 3182US7375323B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2007·Granted May 20, 2008·4 cites·12 claims
- 3282US7199365B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 3, 2007·4 cites·18 claims
- 3382US7049591B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted May 23, 2006·11 cites·9 claims
- 3480US6121610AIon trap mass spectrometerHITACHI LTD·Filed 1998·Granted Sep 19, 2000·34 cites·17 claims
- 3579US9653256B2Charged particle-beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 16, 2017·4 cites·12 claims
- 3679US9123501B2Device for correcting diffraction aberration of electron beamFUKUDA MUNEYUKI·Filed 2011·Granted Sep 1, 2015·4 cites·10 claims
- 3779US8847173B2Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing sameKAWANAMI YOSHIMI·Filed 2011·Granted Sep 30, 2014·5 cites·9 claims
- 3879US7612336B2Scanning electron microscope having a monochromatorHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 3, 2009·4 cites·5 claims
- 3978US7294835B2Scanning electron microscopeHITACHI LTD·Filed 2006·Granted Nov 13, 2007·3 cites·10 claims
- 4078US6982427B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2004·Granted Jan 3, 2006·18 cites·8 claims
- 4177US7435958B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 14, 2008·3 cites·3 claims
- 4277US6501077B1Scanning electron microscopeHITACHI LTD·Filed 1998·Granted Dec 31, 2002·31 cites·14 claims
- 4374US5756993AMass spectrometerHITACHI LTD·Filed 1996·Granted May 26, 1998·26 cites·24 claims
- 4471US9640360B2Ion source and ion beam device using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 2, 2017·2 cites·11 claims
- 4571US9058959B2Scanning ion microscope and secondary particle control methodHITACHI HIGH TECH CORP·Filed 2012·Granted Jun 16, 2015·2 cites·12 claims
- 4670US9355815B2Electron microscope and electron beam detectorHITACHI HIGH TECH CORP·Filed 2013·Granted May 31, 2016·2 cites·8 claims
- 4770US7030376B2Electron beam apparatus and method for production of its specimen chamberHITACHI HIGH TECH CORP·Filed 2003·Granted Apr 18, 2006·6 cites·2 claims
- 4870US5623144AMass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method therebyHITACHI LTD·Filed 1996·Granted Apr 22, 1997·23 cites·26 claims
- 4969US9293293B2Electron gun and charged particle beam device having an aperture with flare-suppressing coatingWATANABE SHUN-ICHI·Filed 2012·Granted Mar 22, 2016·3 cites·11 claims
- 5067US5095208ACharged particle generating device and focusing lens thereforHITACHI LTD·Filed 1989·Granted Mar 10, 1992·14 cites·24 claims
Showing the top 50 of 80 patent records by PatentIndex Score.
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