Assignee
SHICHI HIROYASU
JP·8 granted patents·3 pending applications·63 citations·filing 2008–2012
Top patents by PatentIndex Score
11 records- 0194US8263943B2Ion beam deviceSHICHI HIROYASU·Filed 2010·Granted Sep 11, 2012·16 cites·20 claims
- 0294US8115184B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2008·Granted Feb 14, 2012·20 cites·15 claims
- 0393US8481980B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleSHICHI HIROYASU·Filed 2008·Granted Jul 9, 2013·17 cites·11 claims
- 0479US8563944B2Ion beam deviceSHICHI HIROYASU·Filed 2012·Granted Oct 22, 2013·3 cites·5 claims
- 0578US8431891B2Dual beam apparatus with tilting sample stageSHICHI HIROYASU·Filed 2010·Granted Apr 30, 2013·3 cites·20 claims
- 0677US8796651B2Method and apparatus for specimen fabricationSHICHI HIROYASU·Filed 2011·Granted Aug 5, 2014·2 cites·12 claims
- 0774US8530865B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2012·Granted Sep 10, 2013·2 cites·13 claims
- 0863US8779380B2Ion beam deviceSHICHI HIROYASU·Filed 2009·Granted Jul 15, 2014·0 cites·4 claims
- 0955US2011204225A1ION Beam System and Machining MethodSHICHI HIROYASU·Filed 2011·Application pending·0 cites
- 1041US2013126731A1Charged Particle Microscope and Ion MicroscopeSHICHI HIROYASU·Filed 2011·Application pending·0 cites
- 1140US2012217391A1Charged particle microscopeSHICHI HIROYASU·Filed 2010·Application pending·0 cites
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