Assignee
ARAI NORIAKI
JP·3 granted patents·1 pending application·14 citations·filing 2008–2011
Technology mixH01J4
Top patents by PatentIndex Score
4 records- 0187US8153966B2Electrode unit and charged particle beam deviceARAI NORIAKI·Filed 2009·Granted Apr 10, 2012·11 cites·17 claims
- 0275US8835884B2Charged particle beam apparatus with cleaning photo-irradiation apparatusARAI NORIAKI·Filed 2011·Granted Sep 16, 2014·3 cites·20 claims
- 0360US8698080B2Scanning electron microscopeARAI NORIAKI·Filed 2008·Granted Apr 15, 2014·0 cites·10 claims
- 0437US2012132802A1Gas field ionization ion source apparatus and scanning charged particle microscope equipped with sameARAI NORIAKI·Filed 2010·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →