Inventor · disambiguated record
Yoshitami Sakaguchi
Also filed as: SAKAGUCHI YOSHITAMI
25 granted patents·1 pending application·720 citations·filing 1995–2008
97Inventor score
Top patents by PatentIndex Score
26 records- 0197US6448951B1Liquid crystal display deviceIBM·Filed 1999·Granted Sep 10, 2002·235 cites·22 claims
- 0296US7317326B2Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panelIBM·Filed 2006·Granted Jan 8, 2008·17 cites·5 claims
- 0396US7106089B2Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panelIBM·Filed 2004·Granted Sep 12, 2006·86 cites·14 claims
- 0490US6937233B2Liquid crystal displayIBM·Filed 2002·Granted Aug 30, 2005·42 cites·14 claims
- 0589US7295030B2Thin film transistor tester and corresponding test methodIBM·Filed 2005·Granted Nov 13, 2007·9 cites·17 claims
- 0685US7075505B2Liquid crystal display device, liquid crystal controller and video signal transmission methodAU OPTRONICS CORP·Filed 2000·Granted Jul 11, 2006·40 cites·13 claims
- 0779US7088324B2Liquid crystal display driver and method thereofIBM·Filed 2002·Granted Aug 8, 2006·20 cites·18 claims
- 0879US6806861B1Reference gamma compensation voltage generation circuitIBM·Filed 2000·Granted Oct 19, 2004·19 cites·5 claims
- 0979US6184855B1Liquid crystal display panel driving deviceIBM·Filed 1995·Granted Feb 6, 2001·57 cites·16 claims
- 1078US6556181B2Matrix driven liquid crystal display module system apparatus and methodIBM·Filed 1999·Granted Apr 29, 2003·44 cites·11 claims
- 1178US6525342B2Low resistance wiring in the periphery region of displaysIBM·Filed 2001·Granted Feb 25, 2003·20 cites·17 claims
- 1275US8228269B2Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panelNAKANO DAIJU·Filed 2007·Granted Jul 24, 2012·3 cites·9 claims
- 1371US7091738B2Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panelIBM·Filed 2004·Granted Aug 15, 2006·17 cites·20 claims
- 1469US7079162B2Matrix driven liquid crystal display module system, apparatus and methodAU OPTRONICS CORP·Filed 2003·Granted Jul 18, 2006·9 cites·10 claims
- 1568US7679614B2Matrix driven liquid crystal display module system, apparatus and methodAU OPTRONICS CORP·Filed 2006·Granted Mar 16, 2010·1 cites·2 claims
- 1668US7486100B2Active matrix panel inspection device and inspection methodIBM·Filed 2004·Granted Feb 3, 2009·12 cites·6 claims
- 1765US7974800B2Method, apparatus, and program for detecting the correlation between repeating eventsIBM·Filed 2007·Granted Jul 5, 2011·3 cites·17 claims
- 1862US5739816AAnalog video signal compensating apparatus and TFT liquid crystal display deviceIBM·Filed 1995·Granted Apr 14, 1998·26 cites·6 claims
- 1960US7091667B2Thin film transistor array, display panel, method for inspecting the thin film transistor array, and method for manufacturing active matrix organic light emitting diode panelIBM·Filed 2004·Granted Aug 15, 2006·8 cites·19 claims
- 2059US8140915B2Detecting apparatus, system, program, and detecting methodOHBA NOBUYUKI·Filed 2008·Granted Mar 20, 2012·2 cites·21 claims
- 2159US6661413B2Wiring structure and method thereof for a LCD moduleIBM·Filed 2001·Granted Dec 9, 2003·5 cites·13 claims
- 2258US5734579ARotational-device method and systemIBM·Filed 1995·Granted Mar 31, 1998·23 cites·18 claims
- 2355US7282943B2Inspection device for inspecting TFTIBM·Filed 2004·Granted Oct 16, 2007·8 cites·9 claims
- 2449US5724036ADigital-to-analog converter with gamma compensation and a liquid crystal display device using sameIBM·Filed 1995·Granted Mar 3, 1998·14 cites·10 claims
- 2545US8271981B2Detecting an extraordinary behaviorOHBA NOBUYUKI·Filed 2007·Granted Sep 18, 2012·0 cites·13 claims
- 2641US2008164902A1Inspection device for inspecting tftSAKAGUCHI YOSHITAMI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →