Inventor · disambiguated record
Kiran V. Chatty
Also filed as: CHATTY KIRAN · CHATTY KIRAN V · KAMAL LEGAL REPRESENTATIVE LILIAN
68 granted patents·11 pending applications·776 citations·filing 2003–2020
99Inventor score
Top patents by PatentIndex Score
79 records- 0199US7790524B2Device and design structures for memory cells in a non-volatile random access memory and methods of fabricating such device structuresIBM·Filed 2008·Granted Sep 7, 2010·248 cites·16 claims
- 0297US7790543B2Device structures for a metal-oxide-semiconductor field effect transistor and methods of fabricating such device structuresIBM·Filed 2008·Granted Sep 7, 2010·80 cites·9 claims
- 0397US7763531B2Method and structure to process thick and thin fins and variable fin to fin spacingIBM·Filed 2007·Granted Jul 27, 2010·73 cites·19 claims
- 0497US7301210B2Method and structure to process thick and thin fins and variable fin to fin spacingIBM·Filed 2006·Granted Nov 27, 2007·65 cites·8 claims
- 0596US9876104B2High voltage semiconductor devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2017·Granted Jan 23, 2018·11 cites·10 claims
- 0695US9583482B2High voltage semiconductor devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2015·Granted Feb 28, 2017·11 cites·21 claims
- 0793US8373956B2Low leakage electrostatic discharge protection circuitIBM·Filed 2010·Granted Feb 12, 2013·14 cites·22 claims
- 0892US9425153B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2015·Granted Aug 23, 2016·7 cites·24 claims
- 0990US9620428B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2016·Granted Apr 11, 2017·5 cites·9 claims
- 1090US8169760B2Signal and power supply integrated ESD protection deviceCHANG SHUNHUA T·Filed 2009·Granted May 1, 2012·22 cites·27 claims
- 1188US10361296B2Metal oxide semiconductor (MOS) controlled devices and methods of making the sameMONOLITH SEMICONDUCTOR INC·Filed 2017·Granted Jul 23, 2019·5 cites·17 claims
- 1288US10062749B2High voltage semiconductor devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2014·Granted Aug 28, 2018·7 cites·12 claims
- 1388US8216909B2Field effect transistor with air gap dielectricABADEER WAGDI W·Filed 2009·Granted Jul 10, 2012·14 cites·5 claims
- 1486US8299533B2Vertical NPNP structure in a triple well CMOS processCAMPI JR JOHN B·Filed 2010·Granted Oct 30, 2012·8 cites·24 claims
- 1586US7709896B2ESD protection device and methodINFINEON TECHNOLOGIES AG·Filed 2006·Granted May 4, 2010·15 cites·26 claims
- 1685US10290732B2High voltage semiconductor devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2017·Granted May 14, 2019·3 cites·16 claims
- 1785US8803276B2Electrostatic discharge (ESD) device and method of fabricatingIBM·Filed 2013·Granted Aug 12, 2014·6 cites·13 claims
- 1885US8760827B2Robust ESD protection circuit, method and design structure for tolerant and failsafe designsCAMPI JR JOHN B·Filed 2009·Granted Jun 24, 2014·12 cites·25 claims
- 1985US8349697B2Field effect transistor with air gap dielectricIBM·Filed 2012·Granted Jan 8, 2013·6 cites·5 claims
- 2085US7203045B2High voltage ESD power clampIBM·Filed 2004·Granted Apr 10, 2007·30 cites·9 claims
- 2184US7098513B2Low trigger voltage, low leakage ESD NFETIBM·Filed 2005·Granted Aug 29, 2006·11 cites·20 claims
- 2282US10804175B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2017·Granted Oct 13, 2020·2 cites·10 claims
- 2381US8354722B2SCR/MOS clamp for ESD protection of integrated circuitsIBM·Filed 2011·Granted Jan 15, 2013·6 cites·23 claims
- 2481US8350329B2Low trigger voltage electrostatic discharge NFET in triple well CMOS technologyIBM·Filed 2010·Granted Jan 8, 2013·6 cites·16 claims
- 2580US9214572B2High voltage MOSFET devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2014·Granted Dec 15, 2015·3 cites·20 claims
- 2680US8730624B2Electrostatic discharge power clamp with a JFET based RC trigger circuitCHANG SHUNHUA T·Filed 2011·Granted May 20, 2014·5 cites·12 claims
- 2780US8597993B2Electrostatic discharge (ESD) device and method of fabricatingCHANG SHUNHUA·Filed 2008·Granted Dec 3, 2013·8 cites·13 claims
- 2879US8796731B2Low leakage, low capacitance electrostatic discharge (ESD) silicon controlled recitifer (SCR), methods of manufacture and design structureABOU-KHALIL MICHEL J·Filed 2010·Granted Aug 5, 2014·5 cites·23 claims
- 2979US8110483B2Forming an extremely thin semiconductor-on-insulator (ETSOI) layerABADEER WAGDI W·Filed 2009·Granted Feb 7, 2012·7 cites·8 claims
- 3078US9035395B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2014·Granted May 19, 2015·5 cites·12 claims
- 3178US8513738B2ESD field-effect transistor and integrated diffusion resistorCAMPI JR JOHN B·Filed 2011·Granted Aug 20, 2013·5 cites·26 claims
- 3277US7939395B2High-voltage SOI MOS device structure and method of fabricationIBM·Filed 2009·Granted May 10, 2011·6 cites·20 claims
- 3374US10622472B2Metal oxide semiconductor (MOS) controlled devices and methods of making the sameMONOLITH SEMICONDUCTOR INC·Filed 2019·Granted Apr 14, 2020·1 cites·15 claims
- 3474US10361302B2High voltage MOSFET devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2017·Granted Jul 23, 2019·1 cites·7 claims
- 3574US8994118B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2014·Granted Mar 31, 2015·4 cites·11 claims
- 3672US11315845B2Semiconductor devices comprising getter layers and methods of making and using the sameMONOLITH SEMICONDUCTOR INC·Filed 2020·Granted Apr 26, 2022·0 cites·12 claims
- 3772US10692999B2High voltage MOSFET devices and methods of making the devicesMONOLITH SEMICONDUCTOR INC·Filed 2018·Granted Jun 23, 2020·1 cites·9 claims
- 3869US7457086B2High voltage ESD power clampIBM·Filed 2006·Granted Nov 25, 2008·3 cites·2 claims
- 3969US6730552B1MOSFET with decoupled halo before extensionIBM·Filed 2003·Granted May 4, 2004·14 cites·9 claims
- 4068US7737498B2Enhanced stress-retention silicon-on-insulator devices and methods of fabricating enhanced stress retention silicon-on-insulator devicesIBM·Filed 2008·Granted Jun 15, 2010·3 cites·20 claims
- 4168US7138313B2Method for creating a self-aligned SOI diode by removing a polysilicon gate during processingIBM·Filed 2004·Granted Nov 21, 2006·13 cites·20 claims
- 4267US8614489B2Vertical NPNP structure in a triple well CMOS processCAMPI JOHN B·Filed 2012·Granted Dec 24, 2013·2 cites·19 claims
- 4366US11309414B2Metal oxide semiconductor (MOS) controlled devices and methods of making the sameMONOLITH SEMICONDUCTOR INC·Filed 2020·Granted Apr 19, 2022·0 cites·18 claims
- 4466US7709926B2Device structures for active devices fabricated using a semiconductor-on-insulator substrate and design structures for a radiofrequency integrated circuitIBM·Filed 2008·Granted May 4, 2010·3 cites·13 claims
- 4565US7939911B2Back-end-of-line resistive semiconductor structuresIBM·Filed 2008·Granted May 10, 2011·2 cites·20 claims
- 4660US8634172B2Silicon controlled rectifier based electrostatic discharge protection circuit with integrated JFETs, method of operation and design structureCAMPI JR JOHN B·Filed 2010·Granted Jan 21, 2014·1 cites·22 claims
- 4760US7825475B2Mixed voltage tolerant input/output electrostatic discharge devicesIBM·Filed 2008·Granted Nov 2, 2010·2 cites·13 claims
- 4860US7659497B2On demand circuit function execution employing optical sensingIBM·Filed 2005·Granted Feb 9, 2010·1 cites·15 claims
- 4959US7977201B2Methods for forming back-end-of-line resistive semiconductor structuresIBM·Filed 2008·Granted Jul 12, 2011·1 cites·25 claims
- 5058US7790564B2Methods for fabricating active devices on a semiconductor-on-insulator substrate utilizing multiple depth shallow trench isolationsIBM·Filed 2008·Granted Sep 7, 2010·1 cites·12 claims
Showing the top 50 of 79 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →