Inventor · disambiguated record
Michael A. Ziegerhofer
Also filed as: ZIEGERHOFER MICHAEL A · ZIEGERHOFER MICHAEL ANTHONY
25 granted patents·2 pending applications·202 citations·filing 2005–2020
95Inventor score
Top patents by PatentIndex Score
27 records- 0195US8537627B2Determining fusebay storage element usageOUELLETTE MICHAEL R·Filed 2011·Granted Sep 17, 2013·41 cites·20 claims
- 0295US7251756B2Method and apparatus for increasing fuse programming yield through preferred use of duplicate dataIBM·Filed 2005·Granted Jul 31, 2007·51 cites·30 claims
- 0394US8719648B2Interleaving of memory repair data compression and fuse programming operations in single fusebay architectureGORMAN KEVIN W·Filed 2011·Granted May 6, 2014·35 cites·24 claims
- 0493US8484543B2Fusebay controller structure, system, and methodANAND DARREN L·Filed 2011·Granted Jul 9, 2013·28 cites·20 claims
- 0587US9881694B2Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2015·Granted Jan 30, 2018·6 cites·20 claims
- 0682US8935586B2Staggered start of BIST controllers and BIST enginesIBM·Filed 2012·Granted Jan 13, 2015·6 cites·24 claims
- 0779US7895028B2Structure for increasing fuse programming yieldIBM·Filed 2007·Granted Feb 22, 2011·11 cites·8 claims
- 0873US8214699B2Circuit structure and method for digital integrated circuit performance screeningARSOVSKI IGOR·Filed 2008·Granted Jul 3, 2012·6 cites·20 claims
- 0972US8467260B2Structure and method for storing multiple repair pass data into a fusebayGORMAN KEVIN W·Filed 2011·Granted Jun 18, 2013·5 cites·20 claims
- 1068US10971243B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 6, 2021·1 cites·20 claims
- 1167US8918690B2Decreasing power supply demand during BIST initializationsIBM·Filed 2013·Granted Dec 23, 2014·3 cites·20 claims
- 1266US10692584B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Jun 23, 2020·1 cites·16 claims
- 1363US10839931B2Zero test time memory using background built-in self-testMARVELL INT LTD·Filed 2019·Granted Nov 17, 2020·0 cites·14 claims
- 1461US7757141B2Automatically extensible addressing for shared array built-in self-test (ABIST) circuitryIBM·Filed 2008·Granted Jul 13, 2010·3 cites·7 claims
- 1559US9286181B2Apparatus for capturing results of memory testingGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 15, 2016·1 cites·19 claims
- 1656US10950325B2Memory built-in self test error correcting code (MBIST ECC) for low voltage memoriesMARVELL ASIA PTE LTD·Filed 2019·Granted Mar 16, 2021·1 cites·16 claims
- 1755US11295829B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 5, 2022·0 cites·19 claims
- 1854US10490296B2Memory built-in self-test (MBIST) test time reductionGLOBALFOUNDRIES INC·Filed 2016·Granted Nov 26, 2019·1 cites·20 claims
- 1954US8570820B2Selectable repair pass maskingGORMAN KEVIN WILLIAM·Filed 2011·Granted Oct 29, 2013·2 cites·20 claims
- 2052US11288120B2Circuit and method for soft-error protection in operation of ECC and registerMARVELL ASIA PTE LTD·Filed 2020·Granted Mar 29, 2022·0 cites·20 claims
- 2150US10553302B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Feb 4, 2020·0 cites·20 claims
- 2249US9859019B1Programmable counter to control memory built in self-testIBM·Filed 2017·Granted Jan 2, 2018·0 cites·20 claims
- 2348US10438678B2Zero test time memory using background built-in self-testGLOBALFOUNDRIES INC·Filed 2017·Granted Oct 8, 2019·0 cites·20 claims
- 2439US8595678B2Validating interconnections between logic blocks in a circuit descriptionMONROE CRAIG M·Filed 2012·Granted Nov 26, 2013·0 cites·20 claims
- 2537US7826288B2Device threshold calibration through state dependent burn-inIBM·Filed 2007·Granted Nov 2, 2010·0 cites·17 claims
- 2637US2011029827A1Method, apparatus, and design structure for built-in self-testIBM·Filed 2009·Application pending·0 cites
- 2737US2009099828A1Device Threshold Calibration Through State Dependent BurninARSOVSKI IGOR·Filed 2007·Application pending·0 cites
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