Inventor · disambiguated record
Robin Mair
Also filed as: MAIR ROBIN · MAIR ROBIN A
10 granted patents·6 pending applications·41 citations·filing 2002–2024
85Inventor score
Top patents by PatentIndex Score
16 records- 0185US9576862B2Optical acoustic substrate assessment system and methodRUDOLPH TECH INC·Filed 2014·Granted Feb 21, 2017·8 cites·9 claims
- 0285US7006221B2Metrology system with spectroscopic ellipsometer and photoacoustic measurementsRUDOLPH TECHNOLOGIES INC·Filed 2002·Granted Feb 28, 2006·21 cites·22 claims
- 0385US2025327737A1Opto-acoustic microscopy using an instantaneous signal difference between signals from two discrete delay times acquired with a single probe beamONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0481US2025327924A1On-the-fly opto-acoustic microscopyONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0579US2025327758A1Metrology based on time resolved non-acoustic signalsONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0678US9991176B2Non-destructive acoustic metrology for void detectionMEHENDALE MANJUSHA·Filed 2015·Granted Jun 5, 2018·3 cites·23 claims
- 0777US7522272B2Metrology system with spectroscopic ellipsometer and photoacoustic measurementsRUDOLPH TECHNOLOGIES INC·Filed 2007·Granted Apr 21, 2009·7 cites·4 claims
- 0874US2024402074A1Non-destructive inspection and manufacturing metrology systems and methodsONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 0971US7253887B2Metrology system with spectroscopic ellipsometer and photoacoustic measurementsRUDOLPH TECHNOLOGIES INC·Filed 2006·Granted Aug 7, 2007·2 cites·38 claims
- 1065US2024329005A1Multi pump-probe encoding-decoding for opto-acoustic metrologyONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 1161US12092565B2Non-destructive inspection and manufacturing metrology systems and methodsONTO INNOVATION INC·Filed 2020·Granted Sep 17, 2024·0 cites·18 claims
- 1260US12474643B2System and method for performing alignment and overlay measurement through an opaque layerONTO INNOVATION INC·Filed 2021·Granted Nov 18, 2025·0 cites·23 claims
- 1360US7705974B2Metrology system with spectroscopic ellipsometer and photoacoustic measurementsRUDOLPH TECHNOLOGIES INC·Filed 2009·Granted Apr 27, 2010·0 cites·16 claims
- 1459US11988641B2Characterization of patterned structures using acoustic metrologyONTO INNOVATION INC·Filed 2021·Granted May 21, 2024·0 cites·23 claims
- 1550US11668644B2Opto-acoustic measurement of a transparent film stackONTO INNOVATION INC·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
- 1649US2025189605A1System and method for performing characterization of a sampleONTO INNOVATION INC·Filed 2022·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →