Inventor · disambiguated record
John Anthony Rodriguez
Also filed as: RODRIGUEZ JOHN · RODRIGUEZ JOHN A · RODRIGUEZ JOHN ANTHONY
39 granted patents·8 pending applications·337 citations·filing 1997–2023
97Inventor score
Files withTEXAS INSTRUMENTS INC40SUMMERFELT SCOTT R2BAUMANN ROBERT C1NISHIDA TOSHIKAZU1RODRIGUEZ JOHN1
Top patents by PatentIndex Score
47 records- 0197US8441833B2Differential plate line screen test for ferroelectric latch circuitsSUMMERFELT SCOTT R·Filed 2012·Granted May 14, 2013·30 cites·9 claims
- 0293US6856534B2Ferroelectric memory with wide operating voltage and multi-bit storage per cellTEXAS INSTRUMENTS INC·Filed 2002·Granted Feb 15, 2005·95 cites·8 claims
- 0390US8472236B2Differential plate line screen test for ferroelectric latch circuitsTEXAS INSTRUMENTS INC·Filed 2012·Granted Jun 25, 2013·10 cites·10 claims
- 0487US9851914B2Random number generation in ferroelectric random access memory (FRAM)TEXAS INSTRUMENTS INC·Filed 2017·Granted Dec 26, 2017·4 cites·22 claims
- 0583US9767879B2Setting of reference voltage for data sensing in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2016·Granted Sep 19, 2017·7 cites·22 claims
- 0682US6465307B1Method for manufacturing an asymmetric I/O transistorTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 15, 2002·35 cites·19 claims
- 0781US8416598B2Differential plate line screen test for ferroelectric latch circuitsSUMMERFELT SCOTT R·Filed 2010·Granted Apr 9, 2013·6 cites·4 claims
- 0880US8753952B2Integrated circuit with integrated decoupling capacitorsSUMMERFELT SCOTT ROBERT·Filed 2011·Granted Jun 17, 2014·6 cites·4 claims
- 0980US6830938B1Method for improving retention reliability of ferroelectric RAMTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 14, 2004·26 cites·23 claims
- 1079US7149137B2Process monitoring for ferroelectric memory devices with in-line retention testTEXAS INSTRUMENTS INC·Filed 2004·Granted Dec 12, 2006·26 cites·23 claims
- 1178US7667997B2Method to improve ferroelectronic memory performance and reliabilityTEXAS INSTRUMENTS INC·Filed 2007·Granted Feb 23, 2010·8 cites·19 claims
- 1278US7304881B2Ferroelectric memory with wide operating voltage and multi-bit storage per cellTEXAS INSTRUMENTS INC·Filed 2004·Granted Dec 4, 2007·22 cites·6 claims
- 1377US7729156B2Cycling to mitigate imprint in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2007·Granted Jun 1, 2010·10 cites·16 claims
- 1475US9552880B2Screening for later life stuck bits in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 24, 2017·4 cites·20 claims
- 1574US10152257B2Random number generation in ferroelectric random access memory (FRAM)TEXAS INSTRUMENTS INC·Filed 2017·Granted Dec 11, 2018·1 cites·19 claims
- 1673US7813193B2Ferroelectric memory brake for screening and repairing bitsTEXAS INSTRUMENTS INC·Filed 2008·Granted Oct 12, 2010·9 cites·11 claims
- 1768US8778774B2Enhancement of properties of thin film ferroelectric materialsNISHIDA TOSHIKAZU·Filed 2011·Granted Jul 15, 2014·3 cites·22 claims
- 1867US9070575B2Integrated circuit with integrated decoupling capacitorsTEXAS INSTRUMENTS INC·Filed 2013·Granted Jun 30, 2015·2 cites·13 claims
- 1966US9842662B2Screening for data retention loss in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2015·Granted Dec 12, 2017·2 cites·19 claims
- 2064US11849590B2Capacitor comprising a bismuth metal oxide-based lead titanate thin filmTEXAS INSTRUMENTS INC·Filed 2021·Granted Dec 19, 2023·0 cites·17 claims
- 2161US10216484B2Random number generation with ferroelectric random access memoryTEXAS INSTRUMENTS INC·Filed 2014·Granted Feb 26, 2019·2 cites·20 claims
- 2260US6582977B1Methods for determining charging in semiconductor processingTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 24, 2003·7 cites·30 claims
- 2355US6928376B2Apparatus and methods for ferroelectric ram fatigue testingTEXAS INSTRUMENTS INC·Filed 2002·Granted Aug 9, 2005·7 cites·30 claims
- 2454US9607717B2Reliability screening of ferroelectric memories in integrated circuitsTEXAS INSTRUMENTS INC·Filed 2014·Granted Mar 28, 2017·1 cites·20 claims
- 2553US11495607B2Low-temperature passivation of ferroelectric integrated circuits for enhanced polarization performanceTEXAS INSTRUMENTS INC·Filed 2018·Granted Nov 8, 2022·0 cites·20 claims
- 2653US11158642B2Capacitor comprising a bismuth metal oxide-based lead titanate thin filmTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 26, 2021·0 cites·16 claims
- 2753US7894234B2F-SRAM before package solid data writeTEXAS INSTRUMENTS INC·Filed 2009·Granted Feb 22, 2011·2 cites·20 claims
- 2853US7085150B2Methods for enhancing performance of ferroelectic memory with polarization treatmentTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 1, 2006·7 cites·20 claims
- 2951US10546626B2Method and circuit enabling ferroelectric memory to be fixed to a stable stateTEXAS INSTRUMENTS INC·Filed 2018·Granted Jan 28, 2020·0 cites·7 claims
- 3051US10424361B2Physical unclonable function system and methodTEXAS INSTRUMENTS INC·Filed 2018·Granted Sep 24, 2019·0 cites·20 claims
- 3151US2020126607A1Method and circuit enabling ferroelectric memory to be fixed to a stable stateTEXAS INSTRUMENTS INC·Filed 2019·Application pending·0 cites
- 3250US7894284B2Ferroelectric memory bake for screening and repairing bitsTEXAS INSTRUMENTS INC·Filed 2010·Granted Feb 22, 2011·1 cites·11 claims
- 3346US9934840B2Method and circuit enabling ferroelectric memory to be fixed to a stable stateTEXAS INSTRUMENTS INC·Filed 2015·Granted Apr 3, 2018·0 cites·3 claims
- 3446US2015021999A1Grid apportioning bimodal power module and methodRODRIGUEZ JOHN A·Filed 2013·Application pending·0 cites
- 3544US2024407175A1Ferroelectric temperature sensorTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 3643US10290362B2Screening for data retention loss in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2017·Granted May 14, 2019·0 cites·18 claims
- 3743US2016086960A1Low-Temperature Passivation of Ferroelectric Integrated Circuits for Enhanced Polarization PerformanceTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
- 3842US10153053B2Fusible link cell with dual bit storageTEXAS INSTRUMENTS INC·Filed 2017·Granted Dec 11, 2018·0 cites·20 claims
- 3942US2009279342A1Method to Improve Ferroelectric Memory Performance and ReliabilityTEXAS INSTRUMENTS INC·Filed 2009·Application pending·0 cites
- 4042US2011085369A1Method to improve ferroelectric memory performance and reliabilityTEXAS INSTRUMENTS INC·Filed 2010·Application pending·0 cites
- 4142US2012127777A1Method to improve ferroelectric memory performance and reliabilityRODRIGUEZ JOHN·Filed 2012·Application pending·0 cites
- 4241US10573367B2Setting of reference voltage for data sensing in ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2017·Granted Feb 25, 2020·0 cites·20 claims
- 4340US9824769B2Fusible link cell with dual bit storageTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 21, 2017·0 cites·16 claims
- 4439US7889535B2F-SRAM margin screenTEXAS INSTRUMENTS INC·Filed 2009·Granted Feb 15, 2011·0 cites·20 claims
- 4539US7263455B2Apparatus and methods for ferroelectric ram fatigue testingTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 28, 2007·0 cites·7 claims
- 4633US6060372AMethod for making a semiconductor device with improved sidewall junction capacitanceTEXAS INSTRUMENTS INC·Filed 1997·Granted May 9, 2000·4 cites·14 claims
- 4731US2004190322A1Circuit and method for reducing the effects of memory imprintingBAUMANN ROBERT C·Filed 2003·Application pending·0 cites
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