Inventor · disambiguated record
Kanako Harada
Also filed as: HARADA KANAKO
2 granted patents·2 pending applications·42 citations·filing 2002–2009
63Inventor score
Top patents by PatentIndex Score
4 records- 0185US6826735B2Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor deviceHITACHI LTD·Filed 2002·Granted Nov 30, 2004·34 cites·17 claims
- 0262US6928375B2Inspection condition setting program, inspection device and inspection systemHITACHI HIGH TECH CORP·Filed 2003·Granted Aug 9, 2005·8 cites·14 claims
- 0349US2011202070A1Endoluminal robotic systemDARIO PAOLO·Filed 2009·Application pending·0 cites
- 0444US2005195396A1Inspection condition setting program, inspection device and inspection systemHITACHI HIGH TECH CORP·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →