Inventor · disambiguated record
Yoshitaka Moriyasu
Also filed as: MORIYASU YOSHITAKA
5 granted patents·5 pending applications·58 citations·filing 1999–2023
75Inventor score
Top patents by PatentIndex Score
10 records- 0179US11002806B2Magnetic field detection deviceASAHI KASEI MICRODEVICES CORP·Filed 2019·Granted May 11, 2021·2 cites·15 claims
- 0275US2023324476A1Magnetic field measurement apparatus, magnetic field measurement method, and storage medium with magnetic field measurement program stored thereonASAHI KASEI MICRODEVICES CORP·Filed 2023·Application pending·0 cites
- 0370US7768048B2Infrared sensor IC, and infrared sensor and manufacturing method thereofASAHI KASEI EMD CORP·Filed 2004·Granted Aug 3, 2010·17 cites·38 claims
- 0469US6528387B1SOI substrate and process for preparing the same, and semiconductor device and process for preparing the sameASAHI CHEMICAL IND·Filed 1999·Granted Mar 4, 2003·39 cites·77 claims
- 0558US12274538B2Magnetic field measuring apparatus, magnetic field measuring method, and recording medium storing magnetic field measuring programASAHI KASEI MICRODEVICES CORP·Filed 2021·Granted Apr 15, 2025·0 cites·18 claims
- 0656US2019377035A1Magnetic field measurement apparatus, magnetic field measurement method, and storage medium with magnetic field measurement program stored thereonASAHI KASEI MICRODEVICES CORP·Filed 2019·Application pending·0 cites
- 0748US11927646B2Magnetic field measuring apparatusASAHI KASEI MICRODEVICES CORP·Filed 2021·Granted Mar 12, 2024·0 cites·20 claims
- 0843US2019298202A1Magnetocardiographic measurement apparatus, calibration method, and recording medium having recorded thereon calibration programASAHI KASEI MICRODEVICES CORP·Filed 2019·Application pending·0 cites
- 0942US2016035839A1Compound semiconductor stack and semiconductor deviceASAHI KASEI MICRODEVICES CORP·Filed 2014·Application pending·0 cites
- 1041US2010264459A1Infrared sensor IC, and infrared sensor and manufacturing method thereofASAHI CHEMICAL IND·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →