Inventor · disambiguated record
Leonid A. Vasilyev
Also filed as: VASILYEV LEONID · VASILYEV LEONID A
5 granted patents·1 pending application·97 citations·filing 1999–2014
78Inventor score
Top patents by PatentIndex Score
6 records- 0186US8299416B2High speed quantum efficiency measurement apparatus utilizing solid state lightsourceARBORE MARK A·Filed 2010·Granted Oct 30, 2012·11 cites·18 claims
- 0283US6399944B1Measurement of film thickness by inelastic electron scatteringFEI CO·Filed 1999·Granted Jun 4, 2002·77 cites·20 claims
- 0378US8278937B2High speed detection of shunt defects in photovoltaic and optoelectronic devicesVASILYEV LEONID A·Filed 2010·Granted Oct 2, 2012·8 cites·23 claims
- 0448US6635869B2Step function determination of Auger peak intensityFEI CO·Filed 2001·Granted Oct 21, 2003·1 cites·14 claims
- 0545US9537444B2Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing processTAU SCIENCE CORP·Filed 2014·Granted Jan 3, 2017·0 cites·42 claims
- 0638US2005194534A1Method of operating a probe microscopeFiled 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Leonid A. Vasilyev files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →