Inventor · disambiguated record
Rudolf Johannes Peter Gerardus Schampers
Also filed as: SCHAMPERS RUDOLF JOHANNES PERER GERARDUS · SCHAMPERS RUDOLF JOHANNES PETER · SCHAMPERS RUDOLF JOHANNES PETER GERARDUS
10 granted patents·98 citations·filing 2007–2016
87Inventor score
Top patents by PatentIndex Score
10 records- 0192US8170832B2Measurement and endpointing of sample thicknessYOUNG RICHARD J·Filed 2009·Granted May 1, 2012·16 cites·30 claims
- 0290US8754384B1Sample preparation stageFEI CORP·Filed 2014·Granted Jun 17, 2014·45 cites·18 claims
- 0385US8884248B2Forming a vitrified sample for electron microscopyFEI CO·Filed 2013·Granted Nov 11, 2014·6 cites·20 claims
- 0483US9142384B2Method of welding a frozen aqueous sample to a microprobeFEI CO·Filed 2014·Granted Sep 22, 2015·6 cites·19 claims
- 0583US7615745B2Method for separating a minute sample from a work pieceFEI CO·Filed 2007·Granted Nov 10, 2009·20 cites·20 claims
- 0668US8921785B2Cooperating capillary and cap for use in a high-pressure freezerFEI CO·Filed 2013·Granted Dec 30, 2014·1 cites·15 claims
- 0765US9512460B2Method of studying a cryogenic sample in an optical microscopeFEI CO·Filed 2014·Granted Dec 6, 2016·2 cites·17 claims
- 0865US9184025B2Measurement and endpointing of sample thicknessYOUNG RICHARD J·Filed 2012·Granted Nov 10, 2015·1 cites·8 claims
- 0960US8674323B2Forming an electron microscope sample from high-pressure frozen materialFEI CO·Filed 2013·Granted Mar 18, 2014·1 cites·17 claims
- 1037US10475629B2Charged-particle microscope with in situ deposition functionalityFEI CO·Filed 2016·Granted Nov 12, 2019·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →