Inventor · disambiguated record
Adam E. Norton
Also filed as: NORTON ADAM · NORTON ADAM E · NORTON ADAM EALES
51 granted patents·8 pending applications·2,147 citations·filing 1994–2018
99Inventor score
Top patents by PatentIndex Score
59 records- 0199US5486701AMethod and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thicknessPROMETRIX CORP·Filed 1994·Granted Jan 23, 1996·500 cites·42 claims
- 0298US6753961B1Spectroscopic ellipsometer without rotating componentsTHERMA WAVE INC·Filed 2001·Granted Jun 22, 2004·154 cites·29 claims
- 0398US6611330B2System for measuring polarimetric spectrum and other properties of a sampleKLA TENCOR CORP·Filed 2001·Granted Aug 26, 2003·120 cites·249 claims
- 0497US9519206B1High contrast projection screen with stray light rejectionGOOGLE INC·Filed 2015·Granted Dec 13, 2016·14 cites·24 claims
- 0597US5859424AApodizing filter system useful for reducing spot size in optical measurements and other applicationsKLA TENCOR CORP·Filed 1997·Granted Jan 12, 1999·342 cites·69 claims
- 0696US6184984B1System for measuring polarimetric spectrum and other properties of a sampleKLA TENCOR CORP·Filed 1999·Granted Feb 6, 2001·145 cites·90 claims
- 0796US5917594ASpectroscopic measurement system using an off-axis spherical mirror and refractive elementsKLA TENCOR CORP·Filed 1998·Granted Jun 29, 1999·159 cites·60 claims
- 0895US9915823B1Lightguide optical combiner for head wearable displayGOOGLE LLC·Filed 2014·Granted Mar 13, 2018·23 cites·16 claims
- 0995US5747813ABroadband microspectro-reflectometerKLA TENCOP CORP·Filed 1994·Granted May 5, 1998·259 cites·57 claims
- 1094US9336729B2Optical configurations in a tileable display apparatusGOOGLE INC·Filed 2014·Granted May 10, 2016·8 cites·30 claims
- 1194US8233148B2Hyperspectral imaging systemsBODKIN ANDREW·Filed 2007·Granted Jul 31, 2012·38 cites·25 claims
- 1294US6778273B2Polarimetric scatterometer for critical dimension measurements of periodic structuresTHERMA WAVE INC·Filed 2002·Granted Aug 17, 2004·51 cites·12 claims
- 1393US7304735B2Broadband wavelength selective filterKLA TENCOR TECHNOLOGIES·Filed 2005·Granted Dec 4, 2007·29 cites·24 claims
- 1490US9500906B2Optical configurations in a tileable display apparatusGOOGLE INC·Filed 2016·Granted Nov 22, 2016·4 cites·16 claims
- 1589US9529563B2Masking mechanical separations between tiled display panelsGOOGLE INC·Filed 2014·Granted Dec 27, 2016·7 cites·18 claims
- 1689US7289219B2Polarimetric scatterometry methods for critical dimension measurements of periodic structuresTOKYO ELECTRON LTD·Filed 2005·Granted Oct 30, 2007·10 cites·20 claims
- 1788US9250508B1Rear projection screen with pin-hole concentrator arrayGOOGLE INC·Filed 2014·Granted Feb 2, 2016·10 cites·20 claims
- 1887US10429646B2Free space optical combiner with prescription integrationGOOGLE INC·Filed 2015·Granted Oct 1, 2019·6 cites·6 claims
- 1987US9626145B1Tileable display with pixel-tapeGOOGLE INC·Filed 2014·Granted Apr 18, 2017·12 cites·23 claims
- 2087US7145654B2Method and apparatus to reduce spotsize in an optical metrology instrumentTOKYO ELECTRON LTD·Filed 2004·Granted Dec 5, 2006·29 cites·46 claims
- 2186US9176370B1High contrast rear projection screenGOOGLE INC·Filed 2014·Granted Nov 3, 2015·7 cites·12 claims
- 2286US7660696B1Apparatus for auto focusing a workpiece using two or more focus parametersTOKYO ELECTRON LTD·Filed 2008·Granted Feb 9, 2010·15 cites·17 claims
- 2382US6323946B1Spectroscopic measurement system using curved mirrorKLA TENCOR CORP·Filed 1999·Granted Nov 27, 2001·48 cites·76 claims
- 2481US6677602B1Notch and flat sensor for wafer alignmentSENSYS INSTR CORP·Filed 2001·Granted Jan 13, 2004·26 cites·15 claims
- 2580US9594277B1Multi-domain pixel arrayGOOGLE INC·Filed 2015·Granted Mar 14, 2017·2 cites·8 claims
- 2680US6909507B2Polarimetric scatterometry methods for critical dimension measurements of periodic structuresTHERMA WAVE INC·Filed 2004·Granted Jun 21, 2005·12 cites·18 claims
- 2779US6583877B2Spectroscopic measurement system using an off-axis spherical mirror and refractive elementsFiled 2002·Granted Jun 24, 2003·17 cites·32 claims
- 2878US8030631B2Apparatus for controlling angle of incidence of multiple illumination beamsTOKYO ELECTRON LTD·Filed 2009·Granted Oct 4, 2011·5 cites·20 claims
- 2978US7081957B2Aperture to reduce sensitivity to sample tilt in small spotsize reflectometersTHERMA WAVE INC·Filed 2004·Granted Jul 25, 2006·14 cites·8 claims
- 3078US6667805B2Small-spot spectrometry instrument with reduced polarizationSENSYS INSTR CORP·Filed 2001·Granted Dec 23, 2003·15 cites·25 claims
- 3177US7961306B2Optimizing sensitivity of optical metrology measurementsTOKYO ELECTRON LTD·Filed 2009·Granted Jun 14, 2011·9 cites·20 claims
- 3276US8917459B2Ergonomic vertical vision redirectionKLEIN ERIC A·Filed 2012·Granted Dec 23, 2014·9 cites·19 claims
- 3374US7471392B2Polarimetric scatterometry methods for critical dimension measurements of periodic structuresTOKYO ELECTRON LTD·Filed 2007·Granted Dec 30, 2008·2 cites·20 claims
- 3472US7215419B2Method and apparatus for position-dependent optical metrology calibrationTOKYO ELECTRON LTD·Filed 2006·Granted May 8, 2007·2 cites·17 claims
- 3572US7099081B2Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer thereforTOKYO ELECTRON LTD·Filed 2002·Granted Aug 29, 2006·10 cites·7 claims
- 3671US7095496B2Method and apparatus for position-dependent optical metrology calibrationTOKYO ELECTRON LTD·Filed 2002·Granted Aug 22, 2006·7 cites·21 claims
- 3769US7924422B2Calibration method for optical metrologyTOKYO ELECTRON LTD·Filed 2009·Granted Apr 12, 2011·5 cites·16 claims
- 3868US8030632B2Controlling angle of incidence of multiple-beam optical metrology toolsTOKYO ELECTRON LIMTED·Filed 2009·Granted Oct 4, 2011·5 cites·20 claims
- 3967US7224450B2Method and apparatus for position-dependent optical metrology calibrationTOKYO ELECTRON LTD·Filed 2006·Granted May 29, 2007·1 cites·4 claims
- 4067US7158229B2Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer thereforTOKYO ELECTRON LTD·Filed 2006·Granted Jan 2, 2007·3 cites·32 claims
- 4163US6919958B2Wafer metrology apparatus and methodTHERMA WAVE INC·Filed 2003·Granted Jul 19, 2005·7 cites·3 claims
- 4259US9690535B2Optical configurations in a tileable display apparatusX DEV LLC·Filed 2016·Granted Jun 27, 2017·0 cites·12 claims
- 4356US2019271844A1Lightguide optical combiner for head wearable displayGOOGLE LLC·Filed 2018·Application pending·0 cites
- 4455US9778555B2High contrast projection screen with stray light rejectionX DEV LLC·Filed 2016·Granted Oct 3, 2017·0 cites·24 claims
- 4553US8107073B2Diffraction order sorting filter for optical metrologyNORTON ADAM·Filed 2009·Granted Jan 31, 2012·2 cites·16 claims
- 4652US9256115B1Dual sided lens array using clear beadsGOOGLE INC·Filed 2014·Granted Feb 9, 2016·0 cites·14 claims
- 4750US6870617B2Accurate small-spot spectrometry systems and methodsTHERMA WAVE INC·Filed 2004·Granted Mar 22, 2005·2 cites·16 claims
- 4850US6738136B2Accurate small-spot spectrometry instrumentTHERMA WAVE INC·Filed 2002·Granted May 18, 2004·2 cites·12 claims
- 4948US7248362B2Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer thereforTOKYO ELECTRON LTD·Filed 2006·Granted Jul 24, 2007·0 cites·21 claims
- 5048US2016091786A1Screen configuration for display systemGOOGLE INC·Filed 2014·Application pending·0 cites
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →