Inventor · disambiguated record
Brian L. Brown
Also filed as: BROWN BRIAN · BROWN BRIAN L · BROWN BRIAN LEWIS
22 granted patents·3 pending applications·543 citations·filing 1994–2025
96Inventor score
Top patents by PatentIndex Score
25 records- 0190US9703574B2Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2013·Granted Jul 11, 2017·7 cites·37 claims
- 0289US6233190B1Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·57 cites·41 claims
- 0388US6279035B1Optimizing flow detection and reducing control plane processing in a multi-protocol over ATM (MPOA) systemNORTEL NETWORKS LTD·Filed 1998·Granted Aug 21, 2001·126 cites·36 claims
- 0487US11016790B2Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2017·Granted May 25, 2021·2 cites·20 claims
- 0587US6351427B1Stored write scheme for high speed/wide bandwidth memory devicesTEXAS INSTRUMENTS INC·Filed 1998·Granted Feb 26, 2002·68 cites·35 claims
- 0686US6778453B2Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·32 cites·54 claims
- 0785US6552945B2Method for storing a temperature threshold in an integrated circuit, method for storing a temperature threshold in a dynamic random access memory, method of modifying dynamic random access memory operation in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 22, 2003·30 cites·32 claims
- 0884US10929154B2Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 23, 2021·1 cites·20 claims
- 0981US2024020134A1Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 1077US2025156197A1Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1175US6144598AMethod and apparatus for efficiently testing rambus memory devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 7, 2000·34 cites·31 claims
- 1274US11775320B2Overflow detection and correction in state machine enginesMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 3, 2023·0 cites·20 claims
- 1374US6208570B1Redundancy test method for a semiconductor memoryTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 27, 2001·35 cites·11 claims
- 1474US5557219AInterface level programmabilityTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 17, 1996·29 cites·2 claims
- 1571US6314036B1Method and apparatus for efficiently testing RAMBUS memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 6, 2001·17 cites·22 claims
- 1670US6005430AClock skew circuitTEXAS INSTRUMENTS INC·Filed 1998·Granted Dec 21, 1999·24 cites·21 claims
- 1767US5440248APower-saver differential input bufferTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 8, 1995·19 cites·19 claims
- 1867US2025084273A1Uv curable coatings system for improved scratch resistanceSWIMC LLC·Filed 2024·Application pending·0 cites
- 1965US6615391B2Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2002·Granted Sep 2, 2003·9 cites·7 claims
- 2054US6049241AClock skew circuitTEXAS INSTRUMENTS INC·Filed 1998·Granted Apr 11, 2000·27 cites·18 claims
- 2145US5910923AMemory access circuits for test time reductionTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 8, 1999·9 cites·6 claims
- 2244US6028811AArchitecture for high bandwidth wide I/O memory devicesTEXAS INSTRUMENTS INC·Filed 1998·Granted Feb 22, 2000·9 cites·23 claims
- 2332US6408411B1Two pass multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 18, 2002·4 cites·6 claims
- 2432US6381718B1Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 30, 2002·4 cites·7 claims
- 2529US6111811AHigh-speed synchronous output driverTEXAS INSTRUMENTS INC·Filed 1999·Granted Aug 29, 2000·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →