Inventor · disambiguated record
Alan Hales
Also filed as: HALES ALAN · HALES ALAN D · HALES ALAN DAVID
25 granted patents·2 pending applications·201 citations·filing 2002–2021
96Inventor score
Top patents by PatentIndex Score
27 records- 0197US6894308B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2002·Granted May 17, 2005·61 cites·5 claims
- 0296US8299464B2Comparator receiving expected and mask data from circuit padsWHETSEL LEE D·Filed 2010·Granted Oct 30, 2012·11 cites·3 claims
- 0395US7842949B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2009·Granted Nov 30, 2010·15 cites·5 claims
- 0493US7491970B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2008·Granted Feb 17, 2009·13 cites·6 claims
- 0592US7655946B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2008·Granted Feb 2, 2010·11 cites·1 claims
- 0690US9562946B2Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different padsTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 7, 2017·2 cites·3 claims
- 0790US8525565B2Family of multiplexer/flip-flops with enhanced testabilityRAHMAN MUJIBUR·Filed 2010·Granted Sep 3, 2013·14 cites·10 claims
- 0890US8205125B2Enhanced control in scan tests of integrated circuits with partitioned scan chainsHALES ALAN DAVID·Filed 2009·Granted Jun 19, 2012·40 cites·4 claims
- 0989US9322879B2Integrated circuit wafer having integrated circuit die with plural comparators receiving expected data and mask data from different padsTEXAS INSTRUMENTS INC·Filed 2015·Granted Apr 26, 2016·2 cites·3 claims
- 1089US8375265B1Delay fault testing using distributed clock dividersTEXAS INSTRUMENTS INC·Filed 2011·Granted Feb 12, 2013·9 cites·20 claims
- 1187US10120025B2Functional core circuitry with serial scan test expected, mask circuitryTEXAS INSTRUMENTS INC·Filed 2017·Granted Nov 6, 2018·1 cites·6 claims
- 1286US7183570B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2005·Granted Feb 27, 2007·7 cites·5 claims
- 1384US8872178B2IC with comparator receiving expected and mask data from padsTEXAS INSTRUMENTS INC·Filed 2014·Granted Oct 28, 2014·2 cites·5 claims
- 1482US7469372B2Scan sequenced power-on initializationTEXAS INSTRUMENTS INC·Filed 2006·Granted Dec 23, 2008·11 cites·13 claims
- 1572US11768240B2Re-programmable self-testTEXAS INSTRUMENTS INC·Filed 2021·Granted Sep 26, 2023·0 cites·11 claims
- 1669US9829538B2IC expected data and mask data on I/O data padsTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 28, 2017·0 cites·3 claims
- 1765US9103885B2Integrated circuit with plural comparators receiving expected data and mask data from different padsTEXAS INSTRUMENTS INC·Filed 2014·Granted Aug 11, 2015·0 cites·3 claims
- 1863US8692248B2Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitryTEXAS INSTRUMENTS INC·Filed 2013·Granted Apr 8, 2014·0 cites·3 claims
- 1960US8604475B2IC dies with serarate connections to expected and mask dataWHETSEL LEE D·Filed 2012·Granted Dec 10, 2013·0 cites·2 claims
- 2059US10247780B2Re-programmable self-testTEXAS INSTRUMENTS INC·Filed 2017·Granted Apr 2, 2019·0 cites·19 claims
- 2155US9702935B2Packet based integrated circuit testingTEXAS INSTRUMENTS INC·Filed 2014·Granted Jul 11, 2017·0 cites·20 claims
- 2251US7039823B2On-chip reset circuitry and methodTEXAS INSTRUMENTS INC·Filed 2003·Granted May 2, 2006·2 cites·5 claims
- 2349US11092650B2Re-programmable self-testTEXAS INSTRUMENTS INC·Filed 2019·Granted Aug 17, 2021·0 cites·16 claims
- 2449US2007114529A1Scan testing system, method and apparatusTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 2543US7389455B2Register file initialization to prevent unknown outputs during testTEXAS INSTRUMENTS INC·Filed 2006·Granted Jun 17, 2008·0 cites·20 claims
- 2638US8397112B2Test chain testability in a system for testing tri-state functionalityRAHMAN MUJIBUR·Filed 2010·Granted Mar 12, 2013·0 cites·14 claims
- 2737US2005204217A1Identical core testing using dedicated compare and mask circuitryFiled 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →