Inventor · disambiguated record
Kazuyoshi Torii
Also filed as: TORII KAZUYOSHI
50 granted patents·10 pending applications·645 citations·filing 1990–2020
98Inventor score
Top patents by PatentIndex Score
60 records- 0197US7321187B2Spark plug and method for manufacturing the spark plugNGK SPARK PLUG CO·Filed 2006·Granted Jan 22, 2008·30 cites·9 claims
- 0295US7084558B2Spark plug and method for manufacturing the spark plugNGK SPARK PLUG CO·Filed 2003·Granted Aug 1, 2006·46 cites·9 claims
- 0391US8098004B2Method for producing spark plug and spark plugKATO TOMOAKI·Filed 2010·Granted Jan 17, 2012·6 cites·10 claims
- 0489US8044562B2Spark plugNGK SPARK PLUG CO·Filed 2008·Granted Oct 25, 2011·11 cites·6 claims
- 0588US6432767B2Method of fabricating semiconductor deviceHITACHI LTD·Filed 2001·Granted Aug 13, 2002·45 cites·15 claims
- 0687US7268047B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2006·Granted Sep 11, 2007·12 cites·8 claims
- 0786US8052495B2Method for producing spark plug by projection welding and spark plug thereofNGK SPARK PLUG CO·Filed 2008·Granted Nov 8, 2011·8 cites·7 claims
- 0885US6097051ASemiconductor device and method of fabricatingHITACHI LTD·Filed 1996·Granted Aug 1, 2000·53 cites·18 claims
- 0983US7630043B2Liquid display device and fabrication method thereofHITACHI DISPLAYS LTD·Filed 2007·Granted Dec 8, 2009·7 cites·18 claims
- 1083US5202275ASemiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1990·Granted Apr 13, 1993·43 cites·23 claims
- 1182US6667199B2Semiconductor device having a replacement gate type field effect transistor and its manufacturing methodHITACHI LTD·Filed 2002·Granted Dec 23, 2003·31 cites·3 claims
- 1279US6800889B2Semiconductor device and fabrication method thereofHITACHI LTD·Filed 2002·Granted Oct 5, 2004·21 cites·22 claims
- 1379US5780882ASemiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1995·Granted Jul 14, 1998·33 cites·8 claims
- 1478US6787451B2Semiconductor device and manufacturing method thereofRENESAS TECH CORP·Filed 2002·Granted Sep 7, 2004·18 cites·18 claims
- 1576US6548847B2Semiconductor integrated circuit device having a first wiring strip exposed through a connecting hole, a transition-metal film in the connecting hole and an aluminum wiring strip thereover, and a transition-metal nitride film between the aluminum wiring strip and the transition-metal filmHITACHI LTD·Filed 2001·Granted Apr 15, 2003·12 cites·33 claims
- 1675US8410673B2Spark plug having a ground electrode of specific alloy composition to which a noble metal tip is joinedTORII KAZUYOSHI·Filed 2009·Granted Apr 2, 2013·2 cites·13 claims
- 1774US8476817B2Spark plugMIYASHITA NAOMICHI·Filed 2010·Granted Jul 2, 2013·3 cites·6 claims
- 1873US8072125B2Spark plug for use in an internal-combustion engine with a bilayer ground electrodeTORII KAZUYOSHI·Filed 2007·Granted Dec 6, 2011·5 cites·8 claims
- 1973US6396092B1Semiconductor device and method for manufacturing the sameHITACHI LTD·Filed 1998·Granted May 28, 2002·28 cites·10 claims
- 2073US5331191ASemiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1992·Granted Jul 19, 1994·24 cites·11 claims
- 2171US8378560B2Spark plugNGK SPARK PLUG CO·Filed 2008·Granted Feb 19, 2013·1 cites·9 claims
- 2271US8344604B2Spark plug for internal combustion engineNGK SPARK PLUG CO·Filed 2008·Granted Jan 1, 2013·4 cites·11 claims
- 2370US7666047B2Method for securing a metal noble tip to an electrode of a spark plug using a resistance and laser welding processNGK SPARK PLUG CO·Filed 2004·Granted Feb 23, 2010·12 cites·12 claims
- 2469US7586554B2Liquid crystal display device and dielectric film usable in the liquid crystal display deviceHITACHI DISPLAYS LTD·Filed 2006·Granted Sep 8, 2009·2 cites·8 claims
- 2568US6881657B2Semiconductor device and method for manufacturing semiconductor deviceSEMICONDUCTOR LEADING EDGE TEC·Filed 2004·Granted Apr 19, 2005·13 cites·14 claims
- 2667US5270232AProcess for fabricating field effect transistorHITACHI LTD·Filed 1992·Granted Dec 14, 1993·27 cites·6 claims
- 2766US6462368B2Ferroelectric capacitor with a self-aligned diffusion barrierHITACHI LTD·Filed 2002·Granted Oct 8, 2002·13 cites·14 claims
- 2863US7989143B2Method of manufacturing a semiconductor device having an organic thin film transistorHITACHI LTD·Filed 2007·Granted Aug 2, 2011·1 cites·25 claims
- 2962US6894334B2Semiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI VLSI ENG·Filed 2003·Granted May 17, 2005·5 cites·33 claims
- 3061US6380574B1Ferroelectric capacitor with a self-aligned diffusion barrierHITACHI LTD·Filed 1998·Granted Apr 30, 2002·25 cites·35 claims
- 3161US6169324B1Semiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1999·Granted Jan 2, 2001·13 cites·19 claims
- 3261US5739589ASemiconductor integrated circuit device process for fabricating the same and apparatus for fabricating the sameHITACHI LTD·Filed 1996·Granted Apr 14, 1998·13 cites·21 claims
- 3359US7714489B2Spark plug including ground electrode with arcuately curved faceNGK SPARK PLUG CO·Filed 2006·Granted May 11, 2010·2 cites·11 claims
- 3458US7969520B2Liquid crystal display device and dielectric film usable in the liquid crystal display deviceHITACHI DISPLAYS LTD·Filed 2009·Granted Jun 28, 2011·0 cites·14 claims
- 3557US7087495B2Method for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Aug 8, 2006·5 cites·20 claims
- 3657US7042055B2Semiconductor device and manufacturing thereofRENESAS TECH CORP·Filed 2002·Granted May 9, 2006·7 cites·30 claims
- 3756US8294344B2Spark plug and weld metal zoneTORII KAZUYOSHI·Filed 2008·Granted Oct 23, 2012·2 cites·9 claims
- 3855US7034369B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2004·Granted Apr 25, 2006·5 cites·15 claims
- 3954US7839064B2Spark plug for internal combustion engineNGK SPARK PLUG CO·Filed 2007·Granted Nov 23, 2010·1 cites·11 claims
- 4053US6144052ASemiconductor device and its manufactureHITACHI LTD·Filed 1996·Granted Nov 7, 2000·13 cites·42 claims
- 4151US12009639B2Spark plugNGK SPARK PLUG CO·Filed 2020·Granted Jun 11, 2024·0 cites·7 claims
- 4251US6342412B1Semiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1999·Granted Jan 29, 2002·8 cites·19 claims
- 4350US6127255ASemiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1997·Granted Oct 3, 2000·8 cites·12 claims
- 4450US5811316AMethod of forming teos oxide and silicon nitride passivation layer on aluminum wiringHITACHI LTD·Filed 1995·Granted Sep 22, 1998·8 cites·13 claims
- 4550US2007001244A1Semiconductor device and manufacturing method thereofRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 4648US2009057787A1Semiconductor deviceNEC ELECTRONICS CORP·Filed 2008·Application pending·0 cites
- 4747US5557147ASemiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the sameHITACHI LTD·Filed 1994·Granted Sep 17, 1996·7 cites·18 claims
- 4844US6338994B1Semiconductor device and method of fabricating thereofHITACHI LTD·Filed 1999·Granted Jan 15, 2002·7 cites·14 claims
- 4944US2005074936A1Method of fabricating a semiconductor device including a reaction barrier film, a diffusion barrier film and a ferroelectric filmFiled 2004·Application pending·0 cites
- 5044US2005249876A1Film forming apparatus and methodSEMICONDUCTOR LEADING EDGE TEC·Filed 2005·Application pending·0 cites
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