Inventor · disambiguated record
Dan Kapp
Also filed as: KAPP DAN
2 granted patents·23 citations·filing 2015–2017
55Inventor score
Technology areasG01N
Files withKLA TENCOR CORP2
Top patents by PatentIndex Score
2 records- 0194US9709510B2Determining a configuration for an optical element positioned in a collection aperture during wafer inspectionKLA TENCOR CORP·Filed 2015·Granted Jul 18, 2017·23 cites·39 claims
- 0257US10215713B2Determining a configuration for an optical element positioned in a collection aperture during wafer inspectionKLA TENCOR CORP·Filed 2017·Granted Feb 26, 2019·0 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →