Inventor · disambiguated record
Hubert Altendorfer
Also filed as: ALTENDORFER HUBERT
6 granted patents·367 citations·filing 1996–2010
87Inventor score
Top patents by PatentIndex Score
6 records- 0196US6271916B1Process and assembly for non-destructive surface inspectionsKLA TENCOR CORP·Filed 1996·Granted Aug 7, 2001·278 cites·34 claims
- 0294US8204296B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferBHASKAR KRIS·Filed 2010·Granted Jun 19, 2012·15 cites·16 claims
- 0393US7796804B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferKLA TENCOR CORP·Filed 2008·Granted Sep 14, 2010·25 cites·28 claims
- 0489US6606153B2Process and assembly for non-destructive surface inspectionsKLA TENCOR CORP·Filed 2001·Granted Aug 12, 2003·31 cites·26 claims
- 0583US7477371B2Process and assembly for non-destructive surface inspectionsKLA TENCOR CORP·Filed 2006·Granted Jan 13, 2009·6 cites·48 claims
- 0679US7102744B2Process and assembly for non-destructive surface inspectionsKLA TENCOR CORP·Filed 2003·Granted Sep 5, 2006·12 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →