Inventor · disambiguated record
Venkatraman Iyer
Also filed as: IYER VENKATRAMAN · IYER VENKATRAMAN K
10 granted patents·1 pending application·73 citations·filing 2012–2022
88Inventor score
Top patents by PatentIndex Score
11 records- 0195US9767986B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2015·Granted Sep 19, 2017·13 cites·21 claims
- 0295US9748294B2Anti-reflection layer for back-illuminated sensorKLA TENCOR CORP·Filed 2015·Granted Aug 29, 2017·15 cites·10 claims
- 0392US8754972B2Integrated multi-channel analog front end and digitizer for high speed imaging applicationsBROWN DAVID L·Filed 2012·Granted Jun 17, 2014·20 cites·39 claims
- 0491US10466212B2Scanning electron microscope and methods of inspecting and reviewing samplesKLA TENCOR CORP·Filed 2017·Granted Nov 5, 2019·7 cites·14 claims
- 0589US10269842B2Anti-reflection layer for back-illuminated sensorKLA TENCOR CORP·Filed 2017·Granted Apr 23, 2019·5 cites·9 claims
- 0683US8748828B2Interposer based imaging sensor for high-speed image acquisition and inspection systemsKLA TENCOR CORP·Filed 2012·Granted Jun 10, 2014·6 cites·33 claims
- 0775US9299738B1Interposer based imaging sensor for high-speed image acquisition and inspection systemsKLA TENCOR CORP·Filed 2014·Granted Mar 29, 2016·3 cites·19 claims
- 0874US9462206B2Integrated multi-channel analog front end and digitizer for high speed imaging applicationsKLA TENCOR CORP·Filed 2014·Granted Oct 4, 2016·2 cites·20 claims
- 0966US9733640B2Method and apparatus for database-assisted requalification reticle inspectionKLA TENCOR CORP·Filed 2012·Granted Aug 15, 2017·1 cites·25 claims
- 1065US10429321B2Apparatus for high-speed imaging sensor data transferKLA TENCOR CORP·Filed 2017·Granted Oct 1, 2019·1 cites·26 claims
- 1155US2022397536A1Sensors, imaging systems, and methods for forming a sensorKLA CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →