Inventor · disambiguated record
Dieter Wilk
Also filed as: WILK DIETER · WILK DIETER E
5 granted patents·3 pending applications·42 citations·filing 2002–2023
77Inventor score
Top patents by PatentIndex Score
8 records- 0186US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 0284US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 0380US6686995B2Two-dimensional UV compatible programmable spatial filterKLA TENCOR TECH CORP·Filed 2002·Granted Feb 3, 2004·26 cites·30 claims
- 0466US2024076656A1High definition molecular array feature generation using photoresist10X GENOMICS INC·Filed 2023·Application pending·0 cites
- 0565US2024026444A1Compositions and methods for generating molecular arrays using oligonucleotide printing and photolithography10X GENOMICS INC·Filed 2023·Application pending·0 cites
- 0660US6686994B2UV compatible programmable spatial filterKLA TENCOR TECH CORP·Filed 2002·Granted Feb 3, 2004·8 cites·31 claims
- 0757US2022228210A1Molecular array generation using photoresist10X GENOMICS INC·Filed 2021·Application pending·0 cites
- 0838US10088345B1Haze and defect distribution and aperture configuration in surface metrology inspectorsKLA TENCOR CORP·Filed 2012·Granted Oct 2, 2018·0 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Dieter Wilk files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →