Inventor · disambiguated record
Paul A. Tervo
Also filed as: TERVO PAUL A
42 granted patents·3 pending applications·2,216 citations·filing 1992–2008
99Inventor score
Top patents by PatentIndex Score
45 records- 0198US6034533ALow-current pogo probe cardFiled 1997·Granted Mar 7, 2000·143 cites·18 claims
- 0297US7009383B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2004·Granted Mar 7, 2006·113 cites·8 claims
- 0397US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 0496US7068057B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2005·Granted Jun 27, 2006·27 cites·11 claims
- 0596US6930498B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Aug 16, 2005·68 cites·1 claims
- 0696US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 0796US5457398AWafer probe station having full guardingCASCADE MICROTECH INC·Filed 1993·Granted Oct 10, 1995·149 cites·22 claims
- 0896US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 0995US7148711B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·25 cites·1 claims
- 1095US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 1195US6636059B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Oct 21, 2003·57 cites·15 claims
- 1295US6486687B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Nov 26, 2002·59 cites·7 claims
- 1395US5604444AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1996·Granted Feb 18, 1997·107 cites·9 claims
- 1494US6801047B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2003·Granted Oct 5, 2004·51 cites·9 claims
- 1594US6642732B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2002·Granted Nov 4, 2003·52 cites·21 claims
- 1694US6380751B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2001·Granted Apr 30, 2002·54 cites·22 claims
- 1794US6232788B1Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·98 cites·8 claims
- 1894US5663653AWafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1995·Granted Sep 2, 1997·91 cites·15 claims
- 1994US5532609AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1995·Granted Jul 2, 1996·89 cites·10 claims
- 2093US6512391B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2002·Granted Jan 28, 2003·42 cites·8 claims
- 2193US5266889AWafer probe station with integrated environment control enclosureCASCADE MICROTECH INC·Filed 1992·Granted Nov 30, 1993·172 cites·6 claims
- 2292US7589518B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Sep 15, 2009·10 cites·5 claims
- 2391US7492147B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2007·Granted Feb 17, 2009·8 cites·10 claims
- 2491US7348787B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2005·Granted Mar 25, 2008·11 cites·8 claims
- 2591US7330023B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Feb 12, 2008·9 cites·4 claims
- 2690US7595632B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2008·Granted Sep 29, 2009·9 cites·9 claims
- 2790US6838890B2Membrane probing systemCASCADE MICROTECH INC·Filed 2000·Granted Jan 4, 2005·34 cites·36 claims
- 2890US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 2989US7292057B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2006·Granted Nov 6, 2007·9 cites·8 claims
- 3088US7403025B2Membrane probing systemCASCADE MICROTECH INC·Filed 2006·Granted Jul 22, 2008·12 cites·6 claims
- 3187US7138813B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2003·Granted Nov 21, 2006·24 cites·20 claims
- 3287US6445202B1Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 1999·Granted Sep 3, 2002·56 cites·20 claims
- 3386US5237267AWafer probe station having auxiliary chucksCASCADE MICROTECH INC·Filed 1992·Granted Aug 17, 1993·60 cites·13 claims
- 3484US7616017B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2007·Granted Nov 10, 2009·5 cites·19 claims
- 3584US7148714B2POGO probe card for low current measurementsCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·7 cites·3 claims
- 3684US6313649B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1997·Granted Nov 6, 2001·71 cites·7 claims
- 3778US6856153B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2003·Granted Feb 15, 2005·11 cites·14 claims
- 3878US6559668B1Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2000·Granted May 6, 2003·11 cites·6 claims
- 3967US6822467B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2002·Granted Nov 23, 2004·6 cites·6 claims
- 4061US7042241B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2004·Granted May 9, 2006·4 cites·5 claims
- 4161US6980012B2Wafer probe station for low-current measurementsCASCASE MICROTECH INC·Filed 2003·Granted Dec 27, 2005·4 cites·8 claims
- 4248US7323895B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2006·Granted Jan 29, 2008·0 cites·14 claims
- 4347US2008252316A1Membrane probing systemCASCADE MICROTECH INC·Filed 2008·Application pending·0 cites
- 4446US2006164112A1Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2006·Application pending·0 cites
- 4540US2004017214A1Low-current pogo probe cardFiled 2003·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →