Inventor · disambiguated record
Bing Li
Also filed as: LI BING · LI BING C
15 granted patents·101 citations·filing 2003–2017
91Inventor score
Top patents by PatentIndex Score
15 records- 0190US9430824B2Machine learning method and apparatus for inspecting reticlesKLA TENCOR CORP·Filed 2014·Granted Aug 30, 2016·10 cites·24 claims
- 0288US9805462B2Machine learning method and apparatus for inspecting reticlesKLA TENCOR CORP·Filed 2017·Granted Oct 31, 2017·5 cites·26 claims
- 0388US9361539B2Object detection systemLOCKHEED CORP·Filed 2015·Granted Jun 7, 2016·5 cites·20 claims
- 0487US9092866B1Airborne mine countermeasuresLI BING·Filed 2012·Granted Jul 28, 2015·9 cites·20 claims
- 0585US10032267B2Automating the assessment of damage to infrastructure assetsLOCKHEED CORP·Filed 2016·Granted Jul 24, 2018·17 cites·16 claims
- 0681US7093207B1Data analysis flow engineKLA TENCOR TECH CORP·Filed 2003·Granted Aug 15, 2006·46 cites·16 claims
- 0772US8718353B2Reticle defect inspection with systematic defect filterLI BING·Filed 2012·Granted May 6, 2014·3 cites·26 claims
- 0870US9898660B2Object detection systemLOCKHEED CORP·Filed 2016·Granted Feb 20, 2018·1 cites·20 claims
- 0969US8855400B2Detection of thin lines for selective sensitivity during reticle inspection using processed imagesWANG ZHENGYU·Filed 2012·Granted Oct 7, 2014·3 cites·21 claims
- 1061US8059861B2Method and system for identifying and recognizing products for sorting/sequencing operationsLI BING·Filed 2008·Granted Nov 15, 2011·2 cites·27 claims
- 1160US9092847B2Detection of thin lines for selective sensitivity during reticle inspection using processed imagesKLA TENCOR CORP·Filed 2014·Granted Jul 28, 2015·0 cites·18 claims
- 1259US9224195B2Reticle defect inspection with systematic defect filterKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·0 cites·17 claims
- 1355US9652843B2Machine learning method and apparatus for inspecting reticlesKLA TENCOR CORP·Filed 2016·Granted May 16, 2017·0 cites·26 claims
- 1442US9329270B2Image-aided illumination assembly and methodLOCKHEED CORP·Filed 2013·Granted May 3, 2016·0 cites·13 claims
- 1538US9607371B2Mesoscopic defect detection for reticle inspectionSHI RUI-FANG·Filed 2014·Granted Mar 28, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →