Inventor · disambiguated record
Chen Dror
Also filed as: DROR CHEN
4 granted patents·18 citations·filing 2014–2021
71Inventor score
Top patents by PatentIndex Score
4 records- 0192US11353799B1System and method for error reduction for metrology measurementsKLA CORP·Filed 2020·Granted Jun 7, 2022·5 cites·25 claims
- 0289US10387608B2Metrology target identification, design and verificationKLA TENCOR CORP·Filed 2017·Granted Aug 20, 2019·6 cites·38 claims
- 0385US9910953B2Metrology target identification, design and verificationKLA TENCOR CORP·Filed 2014·Granted Mar 6, 2018·7 cites·25 claims
- 0451US11978679B2Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrologyKLA CORP·Filed 2021·Granted May 7, 2024·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →