Inventor · disambiguated record
Robert Linder
Also filed as: LINDER ROBERT
2 granted patents·1 pending application·84 citations·filing 1999–2005
64Inventor score
Files withFEI CO2
Top patents by PatentIndex Score
3 records- 0183US6399944B1Measurement of film thickness by inelastic electron scatteringFEI CO·Filed 1999·Granted Jun 4, 2002·77 cites·20 claims
- 0277US7375324B2Stylus system for modifying small structuresFEI CO·Filed 2005·Granted May 20, 2008·7 cites·27 claims
- 0338US2005194534A1Method of operating a probe microscopeFiled 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →