Inventor · disambiguated record
Kwang-Yung Cheong
Also filed as: CHEONG KWANG-YUNG
4 granted patents·1 pending application·167 citations·filing 1998–2006
78Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0184US6223098B1Control system for semiconductor integrated circuit test processSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 24, 2001·39 cites·5 claims
- 0275US7514949B2Testing method detecting localized failure on a semiconductor waferSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 7, 2009·7 cites·26 claims
- 0362US6055463AControl system and method for semiconductor integrated circuit test processSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Apr 25, 2000·120 cites·9 claims
- 0445US2006246611A1Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0543US7094615B2Method of controlling probe tip sanding in semiconductor device testing equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 22, 2006·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →