Inventor · disambiguated record
Sundar Jawaharlal
Also filed as: JAWAHARLAL SUNDAR
3 granted patents·45 citations·filing 2008–2008
71Inventor score
Top patents by PatentIndex Score
3 records- 0188US7937179B2Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defectsAPPLIED MATERIALS INC·Filed 2008·Granted May 3, 2011·24 cites·19 claims
- 0283US7962864B2Stage yield predictionAPPLIED MATERIALS INC·Filed 2008·Granted Jun 14, 2011·15 cites·21 claims
- 0368US8799831B2Inline defect analysis for sampling and SPCNEHMADI YOUVAL·Filed 2008·Granted Aug 5, 2014·6 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →