Inventor · disambiguated record
Jaroslav Stárek
Also filed as: STAREK JAROSLAV · STÁREK JAROSLAV
4 granted patents·6 pending applications·4 citations·filing 2017–2024
61Inventor score
Files withFEI CO10
Top patents by PatentIndex Score
10 records- 0176US10504689B2Method for sample orientation for TEM lamella preparationFEI CO·Filed 2017·Granted Dec 10, 2019·3 cites·20 claims
- 0269US11264200B1Lamella alignment based on a reconstructed volumeFEI CO·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0356US2025166964A1Automatic grid finger detectionFEI CO·Filed 2024·Application pending·0 cites
- 0456US2025174428A1Segmented endpointing for sample preparationFEI CO·Filed 2024·Application pending·0 cites
- 0554US12444569B2Endpointing with determination of remaining distanceFEI CO·Filed 2022·Granted Oct 14, 2025·0 cites·27 claims
- 0653US2024249910A1Support structure of inverted lamella for tall roiFEI CO·Filed 2024·Application pending·0 cites
- 0750US2025308840A1Sample preparation with non-uniform doseFEI CO·Filed 2024·Application pending·0 cites
- 0849US2024297015A1Method of preparing a sample for transmission electron microscopy (tem) analysisFEI CO·Filed 2023·Application pending·0 cites
- 0948US12456186B2Method and system for preparing wedged lamellaFEI CO·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 1048US2025290834A1Preparation of planar lamella from a multi-layer structureFEI CO·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jaroslav Stárek files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →