Inventor · disambiguated record

Yifah Gavra

Also filed as: GAVRA YIFAH

1 granted patent·1 pending application·55 citations·filing 2002–2002

49Inventor score

Technology areasH10P

Files withAPPLIED MATERIALS INC2

Top patents by PatentIndex Score

2 records

0184US6885977B2System to identify a wafer manufacturing problem and method thereforAPPLIED MATERIALS INC·Filed 2002·Granted Apr 26, 2005·55 cites·36 claims
0230US2003135295A1Defect source identifier with static manufacturing execution systemAPPLIED MATERIALS INC·Filed 2002·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →