Inventor · disambiguated record
Der-Min Yuan
Also filed as: YUAN DER-MIN
27 granted patents·5 pending applications·141 citations·filing 1999–2023
95Inventor score
Top patents by PatentIndex Score
32 records- 0184US6453381B1DDR DRAM data coherence schemeETRON TECHNOLOGY INC·Filed 1999·Granted Sep 17, 2002·58 cites·9 claims
- 0280US12154652B2Dynamic random access memory applied to an embedded display portETRON TECH INC·Filed 2023·Granted Nov 26, 2024·0 cites·6 claims
- 0380US7277315B2Multiple power supplies for the driving circuit of local word line driver of DRAMETRON TECHNOLOGY INC·Filed 2005·Granted Oct 2, 2007·15 cites·12 claims
- 0478US9310816B2Immediate response low dropout regulation system and operation method of a low dropout regulation systemETRON TECHNOLOGY INC·Filed 2013·Granted Apr 12, 2016·5 cites·34 claims
- 0576US10634713B2Method for testing semiconductor die pad untouched by probe and related test circuitPIECEMAKERS TECH INC·Filed 2018·Granted Apr 28, 2020·1 cites·14 claims
- 0676US7359265B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2006·Granted Apr 15, 2008·8 cites·4 claims
- 0769US11894098B2Dynamic random access memory applied to an embedded display portETRON TECH INC·Filed 2021·Granted Feb 6, 2024·0 cites·9 claims
- 0866US7370250B2Test patterns to insure read signal integrity for high speed DDR DRAMETRON TECHNOLOGY INC·Filed 2005·Granted May 6, 2008·6 cites·17 claims
- 0965US8432206B2Delay lock loop system with a self-tracking function and method thereofYUAN DER-MIN·Filed 2012·Granted Apr 30, 2013·3 cites·7 claims
- 1065US7843754B2Method of reducing current of memory in self-refreshing mode and related memoryETRON TECHNOLOGY INC·Filed 2008·Granted Nov 30, 2010·4 cites·3 claims
- 1160US7184341B2Method of data flow control for a high speed memoryETRON TECHNOLOGY INC·Filed 2004·Granted Feb 27, 2007·11 cites·12 claims
- 1255US8125838B2System in package integrated circuit with self-generating reference voltageWANG SHIH-HSING·Filed 2010·Granted Feb 28, 2012·2 cites·9 claims
- 1353US10998017B2Dynamic random access memory applied to an embedded display portETRON TECH INC·Filed 2018·Granted May 4, 2021·0 cites·2 claims
- 1453US8345500B2Memory having a disabling circuit and method for disabling the memoryETRON TECHNOLOGY INC·Filed 2010·Granted Jan 1, 2013·1 cites·8 claims
- 1553US7940588B2Chip testing circuitETRON TECHNOLOGY INC·Filed 2009·Granted May 10, 2011·2 cites·20 claims
- 1653US6934899B2Variable self-time scheme for write recovery by low speed testerETRON TECHNOLOGY INC·Filed 2002·Granted Aug 23, 2005·8 cites·18 claims
- 1753US6543015B1Efficient data compression circuit for memory testingETRON TECHNOLOGY INC·Filed 1999·Granted Apr 1, 2003·14 cites·13 claims
- 1848US7978525B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2008·Granted Jul 12, 2011·1 cites·4 claims
- 1948US7924641B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2008·Granted Apr 12, 2011·1 cites·3 claims
- 2047US2014025879A1Dynamic random access memory applied to an embedded display portETRON TECHNOLOGY INC·Filed 2013·Application pending·0 cites
- 2146US7576597B2Electronic device and related method for performing compensation operation on electronic elementETRON TECHNOLOGY INC·Filed 2008·Granted Aug 18, 2009·1 cites·10 claims
- 2242US8228751B2Method of reducing current of memory in self-refreshing mode and related memoryYUAN DER-MIN·Filed 2010·Granted Jul 24, 2012·0 cites·3 claims
- 2342US8154940B2Method of reducing current of memory in self-refreshing mode and related memoryYUAN DER-MIN·Filed 2010·Granted Apr 10, 2012·0 cites·5 claims
- 2440US8169228B2Chip testing circuitYUAN DER-MIN·Filed 2010·Granted May 1, 2012·0 cites·19 claims
- 2538US7983102B2Data detecting apparatus and methods thereofETRON TECHNOLOGY INC·Filed 2009·Granted Jul 19, 2011·0 cites·11 claims
- 2638US2010026372A1Power switch for transmitting a power source of low voltage between regular mode and deep-power-down modeCHANG YEN-AN·Filed 2009·Application pending·0 cites
- 2736US7663949B2Memory row architecture having memory row redundancy repair functionETRON TECHNOLOGY INC·Filed 2007·Granted Feb 16, 2010·0 cites·3 claims
- 2835US2008048727A1Sense amplifier-based latchETRON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 2934US2007268062A1Fuse circuit for repair and detectionETRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 3031US2003206479A1High area efficient data line architectureFiled 2003·Application pending·0 cites
- 3125US9019776B2Memory access circuit for double data/single data rate applicationsHU CHIH-HUEI·Filed 2012·Granted Apr 28, 2015·0 cites·18 claims
- 3223US8284628B2Voltage regulator for memoryHSIA CHUN-CHING·Filed 2011·Granted Oct 9, 2012·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →