Inventor · disambiguated record
Peter Christiaan Tiemeijer
Also filed as: TIEMEIJER PETER · TIEMEIJER PETER C · TIEMEIJER PETER CHRISTIAAN
44 granted patents·8 pending applications·211 citations·filing 1996–2025
97Inventor score
Top patents by PatentIndex Score
52 records- 0197US11955310B2Transmission charged particle microscope with an electron energy loss spectroscopy detectorFEI CO·Filed 2021·Granted Apr 9, 2024·3 cites·10 claims
- 0294US10224174B1Transmission charged particle microscope with imaging beam rotationFEI CO·Filed 2017·Granted Mar 5, 2019·18 cites·10 claims
- 0393US7915584B2TEM with aberration corrector and phase plateFEI CO·Filed 2009·Granted Mar 29, 2011·19 cites·26 claims
- 0488US8071954B2Hybrid phase plateWAGNER RAYMOND·Filed 2009·Granted Dec 6, 2011·17 cites·22 claims
- 0587US2025391649A1EELS Auto-Alignment Using Full Image SimulationFEI CO·Filed 2025·Application pending·0 cites
- 0686US6693282B1Particle-optical apparatus including a particle source that can be switched between high brightness and large beam currentFEI CO·Filed 2000·Granted Feb 17, 2004·26 cites·18 claims
- 0784US10453647B2Emission noise correction of a charged particle sourceFEI CO·Filed 2017·Granted Oct 22, 2019·4 cites·22 claims
- 0884US8633456B2Method for centering an optical element in a TEM comprising a contrast enhancing elementBUIJSSE BART·Filed 2012·Granted Jan 21, 2014·6 cites·20 claims
- 0983US12255045B2Transmission charged particle microscope with an electron energy loss spectroscopy detectorFEI CO·Filed 2024·Granted Mar 18, 2025·0 cites·9 claims
- 1083US11114271B2Sixth-order and above corrected STEM multipole correctorsFEI CO·Filed 2019·Granted Sep 7, 2021·3 cites·20 claims
- 1182US10832901B2EELS detection technique in an electron microscopeFEI CO·Filed 2019·Granted Nov 10, 2020·3 cites·15 claims
- 1282US9934936B2Charged particle microscope with special aperture plateFEI CO·Filed 2015·Granted Apr 3, 2018·4 cites·20 claims
- 1381US12176179B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Dec 24, 2024·0 cites·11 claims
- 1481US11587759B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2018·Granted Feb 21, 2023·2 cites·13 claims
- 1581US10522323B2Electron energy loss spectroscopy with adjustable energy resolutionFEI CO·Filed 2018·Granted Dec 31, 2019·2 cites·20 claims
- 1681US8637821B2Blocking member for use in the diffraction plane of a TEMBUIJSSE BART·Filed 2011·Granted Jan 28, 2014·5 cites·21 claims
- 1781US6593584B2Multi-beam lithography apparatus with mutually different beam limiting aperturesFEI CO·Filed 2000·Granted Jul 15, 2003·19 cites·11 claims
- 1880US9978561B2Post column filter with enhanced energy rangeFEI CO·Filed 2016·Granted May 22, 2018·2 cites·20 claims
- 1980US8405027B2Contrast for scanning confocal electron microscopeLAZAR SORIN·Filed 2011·Granted Mar 26, 2013·7 cites·15 claims
- 2079US12505996B2EELS auto-alignment using full image simulationFEI CO·Filed 2022·Granted Dec 23, 2025·0 cites·20 claims
- 2179US11817290B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Nov 14, 2023·0 cites·9 claims
- 2279US10923308B1Method and system for energy resolved chroma imagingFEI CO·Filed 2019·Granted Feb 16, 2021·2 cites·19 claims
- 2379US10559448B2Transmission charged particle microscope with improved EELS/EFTEM moduleFEI CO·Filed 2018·Granted Feb 11, 2020·2 cites·9 claims
- 2478US10410827B2Gun lens design in a charged particle microscopeFEI CO·Filed 2017·Granted Sep 10, 2019·2 cites·15 claims
- 2578US9524851B2Method of performing spectroscopy in a transmission charged-particle microscopeFEI CO·Filed 2015·Granted Dec 20, 2016·3 cites·18 claims
- 2675US6246058B1Correction device for correcting chromatic aberration in particle-optical apparatusPHILIPS ELECTRON OPTICS BV·Filed 1998·Granted Jun 12, 2001·29 cites·16 claims
- 2774US10971326B2Multi-electron-beam imaging apparatus with improved performanceFEI CO·Filed 2019·Granted Apr 6, 2021·1 cites·12 claims
- 2874US9136087B2Method of investigating and correcting aberrations in a charged-particle lens systemFEI CO·Filed 2013·Granted Sep 15, 2015·3 cites·19 claims
- 2974US8766214B2Method of preparing and imaging a lamella in a particle-optical apparatusFEI CO·Filed 2013·Granted Jul 1, 2014·3 cites·20 claims
- 3074US8692196B2Method of use for a multipole detector for a transmission electron microscopeTIEMEIJER PETER CHRISTIAAN·Filed 2009·Granted Apr 8, 2014·4 cites·11 claims
- 3173US8569693B2Distortion free stigmation of a TEMBISCHOFF MAARTEN·Filed 2012·Granted Oct 29, 2013·4 cites·14 claims
- 3266US2025182997A1Transmission electron microscope with variable effective focal lengthFEI CO·Filed 2024·Application pending·0 cites
- 3362US11715618B2System and method for reducing the charging effect in a transmission electron microscope systemFEI CO·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 3462US9991087B2Spectroscopy in a transmission charged-particle microscopeFEI CO·Filed 2015·Granted Jun 5, 2018·1 cites·9 claims
- 3562US2024347314A1Techniques for electron energy loss spectroscopy at high energyFEI CO·Filed 2023·Application pending·0 cites
- 3661US11948771B2Method of determining an energy width of a charged particle beamFEI CO·Filed 2021·Granted Apr 2, 2024·0 cites·19 claims
- 3760US8859966B2Simultaneous electron detectionTIEMEIJER PETER CHRISTIAAN·Filed 2011·Granted Oct 14, 2014·1 cites·15 claims
- 3859US11988618B2Method and system to determine crystal structureFEI CO·Filed 2021·Granted May 21, 2024·0 cites·20 claims
- 3959US5838004AParticle-optical apparatus comprising a fixed diaphragm for the monochromator filterPHILIPS CORP·Filed 1996·Granted Nov 17, 1998·16 cites·5 claims
- 4059US2024110880A1Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle SystemsFEI CO·Filed 2022·Application pending·0 cites
- 4159US2024242929A1Detectors For MicroscopyFEI CO·Filed 2023·Application pending·0 cites
- 4258US10431420B2Post column filter with enhanced energy rangeFEI CO·Filed 2018·Granted Oct 1, 2019·0 cites·18 claims
- 4355US12100585B2Energy spectrometer with dynamic focusFEI CO·Filed 2021·Granted Sep 24, 2024·0 cites·14 claims
- 4455US11450505B2Magnetic field free sample plane for charged particle microscopeFEI CO·Filed 2020·Granted Sep 20, 2022·0 cites·23 claims
- 4555US2024055222A1System for sensor protection in electron imaging applicationsFEI CO·Filed 2023·Application pending·0 cites
- 4654US2024112878A1Charged particle microscope having vacuum in specimen chamberFEI CO·Filed 2022·Application pending·0 cites
- 4753US2024128050A1Method of automated data acquisition for a transmission electron microscopeFEI CO·Filed 2023·Application pending·0 cites
- 4851US11804357B2Electron optical module for providing an off-axial electron beam with a tunable comaFEI CO·Filed 2021·Granted Oct 31, 2023·0 cites·19 claims
- 4949US9570270B2Method of using an environmental transmission electron microscopeFEI CO·Filed 2014·Granted Feb 14, 2017·0 cites·21 claims
- 5047US11810751B2Method of imaging a specimen using a transmission charged particle microscopeFEI CO·Filed 2021·Granted Nov 7, 2023·0 cites·15 claims
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →