Inventor · disambiguated record
Bruce W. Porth
Also filed as: PORTH BRUCE · PORTH BRUCE W · PORTH BRUCE WALTER
31 granted patents·3 pending applications·52 citations·filing 1999–2024
96Inventor score
Top patents by PatentIndex Score
34 records- 0195US10090422B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2016·Granted Oct 2, 2018·8 cites·19 claims
- 0290US10720538B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2019·Granted Jul 21, 2020·2 cites·13 claims
- 0390US9231131B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2014·Granted Jan 5, 2016·6 cites·6 claims
- 0486US9356164B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2015·Granted May 31, 2016·2 cites·7 claims
- 0581US10170661B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2017·Granted Jan 1, 2019·1 cites·15 claims
- 0677US11049932B2Semiconductor isolation structures comprising shallow trench and deep trench isolationGLOBALFOUNDRIES US INC·Filed 2018·Granted Jun 29, 2021·2 cites·18 claims
- 0775US8796044B2Ferroelectric random access memory with optimized hardmaskIBM·Filed 2012·Granted Aug 5, 2014·3 cites·10 claims
- 0874US10957805B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2019·Granted Mar 23, 2021·0 cites·20 claims
- 0974US10784386B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2019·Granted Sep 22, 2020·0 cites·13 claims
- 1074US2024297216A1Semiconductor on insulator wafer with cavity structuresGLOBALFOUNDRIES US INC·Filed 2024·Application pending·0 cites
- 1173US10622496B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2019·Granted Apr 14, 2020·0 cites·16 claims
- 1270US10763379B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2018·Granted Sep 1, 2020·0 cites·20 claims
- 1370US10535787B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2018·Granted Jan 14, 2020·0 cites·18 claims
- 1470US10367106B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2017·Granted Jul 30, 2019·0 cites·20 claims
- 1567US12027580B2Semiconductor on insulator wafer with cavity structuresGLOBALFOUNDRIES US INC·Filed 2020·Granted Jul 2, 2024·0 cites·17 claims
- 1667US10043940B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2017·Granted Aug 7, 2018·0 cites·22 claims
- 1767US9640684B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2016·Granted May 2, 2017·0 cites·11 claims
- 1865US9634159B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2015·Granted Apr 25, 2017·0 cites·13 claims
- 1965US9466740B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2015·Granted Oct 11, 2016·0 cites·10 claims
- 2065US9423582B2Integrated photodetector waveguide structure with alignment toleranceIBM·Filed 2015·Granted Aug 23, 2016·0 cites·8 claims
- 2164US9716010B2Handle waferIBM·Filed 2013·Granted Jul 25, 2017·1 cites·12 claims
- 2261US7303952B2Method for fabricating doped polysilicon linesIBM·Filed 2004·Granted Dec 4, 2007·8 cites·19 claims
- 2360US11488980B2Wafer with localized semiconductor on insulator regions with cavity structuresGLOBALFOUNDRIES US INC·Filed 2020·Granted Nov 1, 2022·0 cites·19 claims
- 2460US7893479B2Deep trench in a semiconductor structureIBM·Filed 2009·Granted Feb 22, 2011·1 cites·7 claims
- 2558US8458628B2Method for compensating for variations in structures of an integrated circuitCREDENDINO SANTO·Filed 2012·Granted Jun 4, 2013·1 cites·22 claims
- 2656US12381129B2Liner-free through-silicon-vias formed by selective metal depositionGLOBALFOUNDRIES US INC·Filed 2022·Granted Aug 5, 2025·0 cites·20 claims
- 2754US8176446B2Method for compensating for variations in structures of an integrated circuitCREDENDINO SANTO·Filed 2008·Granted May 8, 2012·1 cites·20 claims
- 2853US7101806B2Deep trench formation in semiconductor device fabricationIBM·Filed 2004·Granted Sep 5, 2006·4 cites·12 claims
- 2951US8881072B2Method for compensating for variations in structures of an integrated circuitIBM·Filed 2013·Granted Nov 4, 2014·0 cites·25 claims
- 3049US7573085B2Deep trench formation in semiconductor device fabricationIBM·Filed 2006·Granted Aug 11, 2009·0 cites·1 claims
- 3149US2014203342A1Ferroelectric random access memory with optimized hardmaskIBM·Filed 2014·Application pending·0 cites
- 3248US7223697B2Chemical mechanical polishing methodIBM·Filed 2004·Granted May 29, 2007·2 cites·38 claims
- 3348US6372573B2Self-aligned trench capacitor capping process for high density DRAM cellsTOSHIBA KK·Filed 1999·Granted Apr 16, 2002·10 cites·14 claims
- 3447US2007287275A1Method for fabricating doped polysilicon linesADKISSON JAMES W·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →