Inventor · disambiguated record
Peter Muraoka
Also filed as: MURAOKA PETER · MURAOKA PETER T
10 granted patents·2 pending applications·26 citations·filing 2010–2024
84Inventor score
Top patents by PatentIndex Score
12 records- 0190US10748748B2RF impedance model based fault detectionLAM RES CORP·Filed 2018·Granted Aug 18, 2020·7 cites·30 claims
- 0283US10128090B2RF impedance model based fault detectionLAM RES CORP·Filed 2014·Granted Nov 13, 2018·8 cites·31 claims
- 0378US12148645B2Calibration jig and calibration methodAPPLIED MATERIALS INC·Filed 2024·Granted Nov 19, 2024·0 cites·20 claims
- 0474US12435963B2Apparatus and method for controlling edge ring variationAPPLIED MATERIALS INC·Filed 2023·Granted Oct 7, 2025·0 cites·8 claims
- 0574USD1055006SSupport ring for an interlocking process kit for a substrate processing chamberAPPLIED MATERIALS INC·Filed 2022·Granted Dec 24, 2024·6 cites·1 claims
- 0666US11668553B2Apparatus and method for controlling edge ring variationAPPLIED MATERIALS INC·Filed 2021·Granted Jun 6, 2023·0 cites·16 claims
- 0762USD1042374SSupport pipe for an interlocking process kit for a substrate processing chamberAPPLIED MATERIALS INC·Filed 2022·Granted Sep 17, 2024·3 cites·1 claims
- 0859US11935773B2Calibration jig and calibration methodAPPLIED MATERIALS INC·Filed 2019·Granted Mar 19, 2024·0 cites·13 claims
- 0957US2024429089A1Adjustable edge ring tilt for edge of wafer skew compensationAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1057US2025014878A1Wafer edge profile control using connected edge ring hardwareAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1156USD1042373SSliding ring for an interlocking process kit for a substrate processing chamberAPPLIED MATERIALS INC·Filed 2022·Granted Sep 17, 2024·2 cites·1 claims
- 1226US8906164B2Methods for stabilizing contact surfaces of electrostatic chucksKIMBALL CHRIS·Filed 2010·Granted Dec 9, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →