Inventor · disambiguated record
Yoo-Chul Kong
Also filed as: KONG YOO-CHUL
8 granted patents·4 pending applications·89 citations·filing 2005–2019
85Inventor score
Top patents by PatentIndex Score
12 records- 0195US8309405B2Three dimensional semiconductor memory device and method of fabricating the sameYANG SANG-RYOL·Filed 2011·Granted Nov 13, 2012·44 cites·19 claims
- 0294US9905754B1Method of forming patterns and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 27, 2018·20 cites·20 claims
- 0390US9214409B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Dec 15, 2015·12 cites·20 claims
- 0482US8815676B2Three dimensional semiconductor memory device and method of fabricating the sameYANG SANG-RYOL·Filed 2012·Granted Aug 26, 2014·6 cites·18 claims
- 0571US8557661B2Methods of manufacturing a semiconductor device and a semiconductor memory device therebyYU HAN-GEUN·Filed 2011·Granted Oct 15, 2013·4 cites·16 claims
- 0669US9899404B2Semiconductor deviceYOO JIN HYUK·Filed 2015·Granted Feb 20, 2018·2 cites·19 claims
- 0758US7312117B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 25, 2007·1 cites·24 claims
- 0858US2019272979A1Method of processing a substrate using an ion beam and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 0956US10410839B2Method of processing a substrate using an ion beam and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Sep 10, 2019·0 cites·15 claims
- 1049US2008061352A1Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1138US2012329224A1Method of forming fine pattern and method of manufacturing semiconductor deviceKONG YOO-CHUL·Filed 2012·Application pending·0 cites
- 1238US2018006219A1Methods of manufacturing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →