Inventor · disambiguated record
Takuya Nakaue
Also filed as: NAKAUE TAKUYA
2 granted patents·5 pending applications·0 citations·filing 2006–2008
23Inventor score
Top patents by PatentIndex Score
7 records- 0144US2007278177A1Processing method using atomic force microscope microfabrication deviceKONDO KAZUSHIGE·Filed 2007·Application pending·0 cites
- 0241US7442925B2Working method using scanning probeSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·0 cites·20 claims
- 0339US2009028420A1Photomask defect-shape recognition apparatus, photomask defect-shape recognition method, and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0439US2009092905A1Photomask defect correction device and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0535US8062494B2Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing methodIWATA FUTOSHI·Filed 2007·Granted Nov 22, 2011·0 cites·34 claims
- 0634US2009038383A1Photomask defect correction device and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0731US2007131249A1Probe washing method of scanning probe microscopeNAKAUE TAKUYA·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →