Assignee
NAKAUE TAKUYA
0 granted patents·4 pending applications·0 citations·filing 2006–2008
Top patents by PatentIndex Score
4 records- 0139US2009028420A1Photomask defect-shape recognition apparatus, photomask defect-shape recognition method, and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0239US2009092905A1Photomask defect correction device and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0334US2009038383A1Photomask defect correction device and photomask defect correction methodNAKAUE TAKUYA·Filed 2008·Application pending·0 cites
- 0431US2007131249A1Probe washing method of scanning probe microscopeNAKAUE TAKUYA·Filed 2006·Application pending·0 cites
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