Inventor · disambiguated record
Tsung-Hsuan Hsieh
Also filed as: HSIEH TSUNG-HSUAN
6 granted patents·5 pending applications·29 citations·filing 2001–2014
78Inventor score
Files withIBM3MACRONIX INT CO LTD2GLOBALFOUNDRIES INC1HSIEH TSUNG HSUAN1LENOVO ENTPR SOLUTIONS SINGAPORE PTE LTD1
Top patents by PatentIndex Score
11 records- 0176US6549029B1Circuit and method for measuring capacitanceMACRONIX INT CO LTD·Filed 2001·Granted Apr 15, 2003·21 cites·20 claims
- 0268US9107249B2Adjusting brightness of an optical touch panelTOSHIBA GLOBAL COMMERCE SOLUTIONS HOLDINGS CORP·Filed 2014·Granted Aug 11, 2015·1 cites·20 claims
- 0360US8797296B2Method and device for adjusting brightness of an optical touch panelHSIEH TSUNG HSUAN·Filed 2010·Granted Aug 5, 2014·2 cites·20 claims
- 0458US9594641B2Techniques for updating memory of a chassis management moduleGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 14, 2017·1 cites·11 claims
- 0555US9514846B2Memory module status indicationLENOVO ENTPR SOLUTIONS SINGAPORE PTE LTD·Filed 2014·Granted Dec 6, 2016·2 cites·15 claims
- 0648US2014067920A1Data analysis systemIBM·Filed 2013·Application pending·0 cites
- 0747US2014068180A1Data analysis systemIBM·Filed 2013·Application pending·0 cites
- 0844US6683352B2Semiconductor device structureMACRONIX INT CO LTD·Filed 2002·Granted Jan 27, 2004·2 cites·19 claims
- 0944US2015058542A1Updating techniques for memory of a chassis management moduleIBM·Filed 2014·Application pending·0 cites
- 1033US2003098695A1Circuit and method for measuring capacitanceFiled 2001·Application pending·0 cites
- 1131US2003098740A1MOS-based voltage reference circuitFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →