Inventor · disambiguated record
Syuichi Tsukada
Also filed as: TSUKADA SYUICHI
4 granted patents·2 pending applications·11 citations·filing 2005–2009
68Inventor score
Top patents by PatentIndex Score
6 records- 0167US7847569B2Probe device and method of regulating contact pressure between object to be inspected and probeTOKYO ELECTRON LTD·Filed 2006·Granted Dec 7, 2010·3 cites·7 claims
- 0264US8063652B2Probing apparatus and method for adjusting probing apparatusAMEMIYA TAKASHI·Filed 2006·Granted Nov 22, 2011·4 cites·11 claims
- 0362US7679385B2Probe card for inspecting electric properties of an objectTOKYO ELECTRON LTD·Filed 2007·Granted Mar 16, 2010·2 cites·20 claims
- 0461US8723544B2Structure of probe card for inspecting electrical characteristics of object to be inspectedKOMATSU SHIGEKAZU·Filed 2009·Granted May 13, 2014·2 cites·9 claims
- 0538US2009015281A1Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector, and probe cardJSR CORP·Filed 2008·Application pending·0 cites
- 0634US2008048698A1Probe CardAMEMIYA TAKASHI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →