Assignee
AMEMIYA TAKASHI
JP·1 granted patent·2 pending applications·4 citations·filing 2005–2006
Top patents by PatentIndex Score
3 records- 0164US8063652B2Probing apparatus and method for adjusting probing apparatusAMEMIYA TAKASHI·Filed 2006·Granted Nov 22, 2011·4 cites·11 claims
- 0239US2009171000A1Epdm CompositionAMEMIYA TAKASHI·Filed 2006·Application pending·0 cites
- 0334US2008048698A1Probe CardAMEMIYA TAKASHI·Filed 2005·Application pending·0 cites
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