Inventor · disambiguated record
Christophe David Fouquet
Also filed as: FOUQUET CHRISTOPHE · FOUQUET CHRISTOPHE DAVID
15 granted patents·2 pending applications·182 citations·filing 2001–2024
93Inventor score
Files withASML NETHERLANDS BV11FOUQUET CHRISTOPHE2ABBOTT GORDON1KLA TENCOR CORP1KLA TENCOR TECH CORP1
Top patents by PatentIndex Score
17 records- 0198US11204239B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2020·Granted Dec 21, 2021·7 cites·36 claims
- 0297US11428521B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2021·Granted Aug 30, 2022·3 cites·29 claims
- 0397US10718604B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2019·Granted Jul 21, 2020·6 cites·22 claims
- 0496US9507907B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2015·Granted Nov 29, 2016·18 cites·20 claims
- 0596US7904845B2Determining locations on a wafer to be reviewed during defect reviewKLA TENCOR CORP·Filed 2007·Granted Mar 8, 2011·50 cites·24 claims
- 0694US10579772B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2018·Granted Mar 3, 2020·7 cites·20 claims
- 0794US10386176B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2015·Granted Aug 20, 2019·5 cites·20 claims
- 0894US9990462B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2016·Granted Jun 5, 2018·8 cites·21 claims
- 0990US11080459B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2020·Granted Aug 3, 2021·2 cites·20 claims
- 1089US7747062B2Methods, defect review tools, and systems for locating a defect in a defect review processKLA TENCOR TECH CORP·Filed 2005·Granted Jun 29, 2010·32 cites·30 claims
- 1188US2024403537A1Computational wafer inspectionASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1282US12429328B2Metrology method, target and substrateASML NETHERLANDS BV·Filed 2022·Granted Sep 30, 2025·0 cites·20 claims
- 1380US9710903B2System and method for detecting design and process defects on a wafer using process monitoring featuresFOUQUET CHRISTOPHE·Filed 2009·Granted Jul 18, 2017·10 cites·50 claims
- 1480US7219069B2System and method for creating dynamic facility models with data normalization as attributes change over timeSCHLUMBERGER RESOURCE MAN SERV·Filed 2001·Granted May 15, 2007·18 cites·45 claims
- 1579US8175373B2Use of design information and defect image information in defect classificationABBOTT GORDON·Filed 2009·Granted May 8, 2012·16 cites·21 claims
- 1677US12067340B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2021·Granted Aug 20, 2024·0 cites·23 claims
- 1754US2007219841A1Facility modelization for facility benchmarkingFOUQUET CHRISTOPHE·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →