Inventor · disambiguated record

Scott Olszewski

Also filed as: OLSZEWSKI SCOTT

1 granted patent·1 pending application·8 citations·filing 2008–2009

30Inventor score

Technology areasH10P

Files withAPPLIED MATERIALS INC2

Top patents by PatentIndex Score

2 records

0173US7848840B2Method of controlling process parameters for semiconductor manufacturing apparatusAPPLIED MATERIALS INC·Filed 2008·Granted Dec 7, 2010·8 cites·17 claims
0246US2009272717A1Method and apparatus of a substrate etching system and processAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →